Studies on Surface Reaction Mechanisms in Atomic Layr CVD by HREELS
Studies on Surface Reaction Mechanisms in Atomic Layr CVD by HREELS
批准号:
08455019
负责人:
YASUDA Yukio
金额:
$5.44万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
1996
资助国家:
日本
项目状态:
已结题
起止时间:
1996 至 1998
中文摘要
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英文摘要
In this study, we have investigated the effects of hydrogen atoms on the initial oxidation process, the local bonding structure of SiO 2 and the epitaxial growth process of SiGe films by Si_2H_6- and GeH_4-source molecular beam epitaxy, using high-resolution electron energy loss spectroscopy (HREELS) and reflection high energy electron diffraction (RHEED) . The main results are shown below.We applied a random sequential adsorption model to the experimental results of the initial oxidation on H-terminated Si (100) surfaces. It was found out that oxygen atoms preferentially adsorb on one of two back-bond sites of a surface Si atom on H-terminated Si (lO0) - lx1 and -2x1 surfaces. The preferential adsorption of oxygen atoms cannot be observed on clean Si (100) surfaces, which means that this finding shows something of the oxidation control by hydrogen. Moreover, it was also made clear that the oxidaton hardly progresses into the Si substrate until all back-bond sites of surface Si aotms a … More re occupied by oxygen atoms. This shows that hydrogen is effective for the realization of an abrupt SiO_2/Si interface.In the initial oxidation process of H-terminated Si (111) - lx1 surfaces, oxygen atoms randomly adsorb on the sites between surface and subsurface Si atoms below an oxygen coverage of 2.5 monolayer (ML) . In addition, we clarified that the local bonding structure of Si-O-Si species is hardly influenced by the orientaion of Si substrartes and by the adsorbing hydrogen atom.It was found in the SiGe epitaxial growth on Si (100) and Si (l11) surfaces that the dissociative adsorption rates of Si _2H_6 and GeH _4 are significantly dependent upon the surface orientation and the atomic element at the adsorption sites. This suggests that the surface reactions of Si_2H_6 and GeH_4 molecules are ruled by the electronic states of the substrate surface. The role of atomic hydrogen irradiation in the growth rate of SiGe films is to reduce the density of adsorption sites for the hydride gases and to suppress the surface segregation of Ge atoms. These findings support the realizaiton of the surface reaction control with hydrogen. Less
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H.Ikeda: "Influences of Deuterium Atoms on Local Bending Structures of SiO_2 Studied by HREELS" Thin Solid Films.
H.Ikeda:“通过 HREELS 研究氘原子对 SiO_2 局部弯曲结构的影响”固体薄膜。
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通讯作者:
Hiroya Ikeda: "Initial Oxidation of H-Terminated Si(111) Surfaces Studied by HREELS" Appl.Surf.Sci.117/118. 109-113 (1997)
Hiroya Ikeda:“HREELS 研究的 H 封端 Si(111) 表面的初始氧化”Appl.Surf.Sci.117/118。
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通讯作者:
H.Ikeda, Y.Nakagawa, M.Toshima, S.Furuta, S.Zaima, Y.Yasuda: "Initial Oxidation of H-Terminated Si (111) Surfaces Studied by HREELS" Appl.Surf.Sci.117. 109-113 (1997)
H.Ikeda、Y.Nakakawa、M.Toshima、S.Furuta、S.Zaima、Y.Yasuda:“HREELS 研究的 H 端硅 (111) 表面的初始氧化”Appl.Surf.Sci.117。
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H.Ikeda: "Initial Oxidation Proceses of H-Terminated Si(100) Surfaces Analyzed by a Random Sequential Adsorption Model" Jpn.J.Appl.Phys.
H.Ikeda:“通过随机顺序吸附模型分析 H 封端 Si(100) 表面的初始氧化过程”Jpn.J.Appl.Phys。
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影响因子:
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作者:
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通讯作者:
H.Ikeda: "Initial oxidation of H-terminated Si (111) surfaces studied by HREELS" Appl.Surf.Sci.117/118. 109-113 (1997)
H.Ikeda:“HREELS 研究的 H 封端 Si (111) 表面的初始氧化”Appl.Surf.Sci.117/118。
DOI:
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共 15 条
Exploration of radioactive cesium distribution in forest soil using gamma-ray spectral survey
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财政年份:2000
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Development of Low-Resistivity Contact Materials for Future ULSIs
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批准号:08505001
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资助金额:$21.25万
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财政年份:1996
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负责人:YASUDA Yukio
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依托单位:
STUDY ON INFRA-RED OPTICAL DEVICES BY Si_<1-x>Ge_x HETERO-STRUCTURES
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批准号:06555005
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资助金额:$6.53万
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财政年份:1994
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A study on influences of hydrogen on growth mechanisms of thin films by electron energy loss spectroscopy
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财政年份:1994
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Studies on Quantum Transport Mechanism of Si Quasi-One-Dimensional Carrier Systems by a Time-of-Flight Method with Pulse Lasers
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项目类别:Grant-in-Aid for General Scientific Research (B)
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资助金额:$0.64万
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财政年份:1992
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负责人:YASUDA Yukio
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依托单位:
Development of time-dependent vibration-excited spectroscopy and study on the growth process of semiconductor thin films.
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批准号:02402022
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资助金额:$14.34万
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财政年份:1990
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负责人:YASUDA Yukio
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依托单位:
Investigation of the Mechanism of Ge/Si heteroepitaxial Growth with Interfacial Reactions
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资助金额:$4.67万
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财政年份:1988
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负责人:YASUDA Yukio
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依托单位:
Development and Application of Growth Methods of Functional Thin Films.
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批准号:63302021
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项目类别:Grant-in-Aid for Co-operative Research (A)
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资助金额:$7.23万
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负责人:YASUDA Yukio
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依托单位:
海外基金