Acquisition of an Electron Spectroscopic Imaging Filter for a 400 kV Transmission Electron Microscope

获取用于 400 kV 透射电子显微镜的电子能谱成像滤光片

• 批准号: 9403621
• 负责人: Marc De Graef
• 金额: $ 12万
• 依托单位: Carnegie-Mellon University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1994
• 资助国家: 美国
• 起止时间: 1994-07-01 至 1995-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9403621&HistoricalAwards=false
• 关键词: Acquisition; Electron; Spectroscopic; Imaging; Filter

This work is concerned with the quantitative characterization of materials at the highest levels of spatial resolution. This award will be used to purchase an imaging energy filter, which will be added to a high- resolution transmission electron microscope. The addition of such a filter will open the path to many new observation modes such as elastic bright field imaging, electron spectroscopic imaging and diffraction and electron spectroscopic convergent beam electron diffraction. The filter is to be mounted after the microscope lenses and hence all previously available observation modes will remain accessible. The filter will permit researchers to obtain chemical information at near atomic resolution. Among the projects which will benefit from the energy filter are: extension of the point resolution of the existing instrument down to the information limit by means of energy filtering and wave function retrieval techniques, analysis of the structure of fullerene nanotubes and magnetic nanocrystals, determination of the degree of Cr-segregation in Cobalt alloy thin films used for magnetic recording, in-situ observations of the formation of titanium disulfide platelets from sulfides, in-situ observation of diffusion processes in polycrystalline films, and characterization of the chemical structure of pressure-induced amorphous phases. %%% Quantitative characterization of materials requires not only a complete crystallographic description of the structure, but also a detailed chemical understanding of all defects and internal interfaces at the highest levels of spatial resolution. The addition of this imaging filter to the transmitting electron microscope will permit researchers to obtain chemical information at near atomic resolution for technologically-important materials such as crystalline, quasi-crystalline and amorphous solids, fullerene nanotubes and magnetic nanocrystals, and alloy thin films used for magnetic recording.

这项工作是关注的定量表征的材料在最高水平的空间分辨率。这笔奖金将用于购买成像能量过滤器，该过滤器将被添加到高分辨率透射电子显微镜中。这种滤波器的加入将为弹性明场成像、电子光谱成像和衍射、电子光谱会聚束电子衍射等许多新的观测模式开辟道路。滤光片将安装在显微镜镜头之后，因此所有先前可用的观察模式都将保持可用。这种过滤器将使研究人员能够获得接近原子分辨率的化学信息。将受益于能源过滤器的项目包括：通过能量过滤和波函数恢复技术将现有仪器的点分辨率扩展到信息极限，分析富勒烯纳米管和磁性纳米晶体的结构，测定用于磁记录的钴合金薄膜中的Cr偏析程度，从硫化物形成二硫化钛片晶的原位观察，多晶薄膜中扩散过程的原位观察，以及压力诱导非晶相的化学结构的表征。 材料的定量表征不仅需要对结构进行完整的晶体学描述，还需要以最高水平的空间分辨率对所有缺陷和内部界面进行详细的化学理解。在透射电子显微镜中添加这种成像滤光片将使研究人员能够以近原子分辨率获得技术重要材料的化学信息，如晶体，准晶体和非晶固体，富勒烯纳米管和磁性纳米晶体，以及用于磁记录的合金薄膜。