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Acquisition of an Electron Spectroscopic Imaging Filter for a 400 kV Transmission Electron Microscope

Acquisition of an Electron Spectroscopic Imaging Filter for a 400 kV Transmission Electron Microscope
获取用于 400 kV 透射电子显微镜的电子能谱成像滤光片
批准号:
9403621
负责人:
Marc De Graef
金额:
$12.0万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1994
资助国家:
美国
项目状态:
已结题
起止时间:
1994-07-01 至 1995-06-30

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中文摘要
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英文摘要
This work is concerned with the quantitative characterization of materials at the highest levels of spatial resolution. This award will be used to purchase an imaging energy filter, which will be added to a high- resolution transmission electron microscope. The addition of such a filter will open the path to many new observation modes such as elastic bright field imaging, electron spectroscopic imaging and diffraction and electron spectroscopic convergent beam electron diffraction. The filter is to be mounted after the microscope lenses and hence all previously available observation modes will remain accessible. The filter will permit researchers to obtain chemical information at near atomic resolution. Among the projects which will benefit from the energy filter are: extension of the point resolution of the existing instrument down to the information limit by means of energy filtering and wave function retrieval techniques, analysis of the structure of fullerene nanotubes and magnetic nanocrystals, determination of the degree of Cr-segregation in Cobalt alloy thin films used for magnetic recording, in-situ observations of the formation of titanium disulfide platelets from sulfides, in-situ observation of diffusion processes in polycrystalline films, and characterization of the chemical structure of pressure-induced amorphous phases. %%% Quantitative characterization of materials requires not only a complete crystallographic description of the structure, but also a detailed chemical understanding of all defects and internal interfaces at the highest levels of spatial resolution. The addition of this imaging filter to the transmitting electron microscope will permit researchers to obtain chemical information at near atomic resolution for technologically-important materials such as crystalline, quasi-crystalline and amorphous solids, fullerene nanotubes and magnetic nanocrystals, and alloy thin films used for magnetic recording.
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Low voltage electron back-scatter diffraction: enabling high resolution mapping of heavily deformed materials
  • 批准号:
    2203378
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $84.16万
  • 财政年份:
    2022
  • 负责人:
    Marc De Graef
  • 依托单位:
Forward Model Based Strain Analysis in Highly Deformed Metallic Systems Using Electron Back-Scatter Diffraction Patterns
  • 批准号:
    1904629
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $46.61万
  • 财政年份:
    2019
  • 负责人:
    Marc De Graef
  • 依托单位:
Quantitative Characterization of 3D Vector Fields in Advanced Materials
  • 批准号:
    1564550
  • 项目类别:
    Standard Grant
  • 资助金额:
    $45.58万
  • 财政年份:
    2016
  • 负责人:
    Marc De Graef
  • 依托单位:
Domain Walls in Ferromagnetic Shape Memory Alloys
  • 批准号:
    1306296
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $40.5万
  • 财政年份:
    2013
  • 负责人:
    Marc De Graef
  • 依托单位:
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Muon--electron转换过程的实验研究