Low voltage electron back-scatter diffraction: enabling high resolution mapping of heavily deformed materials

低压电子背散射衍射：实现严重变形材料的高分辨率绘图

• 批准号: 2203378
• 负责人: Marc De Graef
• 金额: $ 84.16万
• 依托单位: Carnegie-Mellon University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2022
• 资助国家: 美国
• 起止时间: 2022-09-01 至 2027-08-31
• 项目状态: 未结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=2203378&HistoricalAwards=false
• 关键词: Low; voltage; electron; back; scatter

Non-technical SummaryModern engineering materials often have a complex microstructure that makes it difficult to accurately predict how they will behave under the influence of a applied forces. Many aspects of the deformation behavior of a material are still poorly understood. Since deformation occurs at a very small length scale, we need to use electron microscopes operated at a fairly high magnification to image the internal behavior of the material at this length scale. In this research project, cutting-edge microscopy techniques are advanced to quantitatively determine the local deformation in a number of metals and alloys; such measurements provide insight into the behavior of these materials, in particular when these metals are used in structural applications in our modern society. These algorithms are available to the community through publications and open source code. Open source text books are developed for the materials community and provide a mechanism for the on-demand creation of free open source text books.Technical SummaryThe thermomechanical processing of materials systems and the subsequent annealing and recrystallization processes have for more than a century now been the subject of numerous experimental and theoretical studies, in particular for metallic systems. Despite extensive work on recrystallization, many details of this process still remain unclear due to the difficulty to quantitatively and accurately characterize the deformed state of a material; this state can be considered as a precursor state, setting the stage for the subsequent annealing process, so understanding this state is of paramount importance. Extracting lattice strains from deformed samples is challenging but requires a renewed attention due to recent improvements in electron back-scattered diffraction (EBSD) detector systems. A physics-based EBSD prediction model is combined with the ability to incorporate the local deformation tensor in the pattern generation algorithm. In particular at lower microscope accelerating voltages, i.e., less than 10 kV, there is the potential to enhance the spatial resolution of EBSD measurements to a few tens of nanometers, especially when combined with sensitive direct electron detectors. Whole pattern matching of EBSD patterns against realistic simulated patterns for a deformed lattice make it possible to routinely reach strain sensitivities of better than 0.0001 over large sample areas. The proposed research consists of a tight combination of computational model development and in-situ experimental work. Portions of this work are carried out in collaboration with colleagues at UCSB and at Johns Hopkins University. All algorithms are made available to the community in peer-reviewed publications and as open source code. On the educational side, the OpenChapters project addresses the issue of rapidly rising cost of material science and engineering text books by creating an open source mechanism for the generation of free text books by a crowd-sourcing approach.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

现代工程材料通常具有复杂的微观结构，这使得难以准确预测它们在施加的力的影响下将如何表现。 材料的变形行为的许多方面仍然知之甚少。由于变形发生在一个非常小的长度尺度，我们需要使用电子显微镜在相当高的放大倍率下操作，以成像在这个长度尺度的材料的内部行为。 在这个研究项目中，先进的显微镜技术可以定量地确定一些金属和合金的局部变形;这种测量可以深入了解这些材料的行为，特别是当这些金属用于现代社会的结构应用时。 这些算法通过出版物和开源代码向社区提供。 开源教科书是为材料社区开发的，并提供了一种按需创建免费开源教科书的机制。技术概述材料系统的热机械加工以及随后的退火和再结晶过程已经有超过世纪的时间，现在已经成为许多实验和理论研究的主题，特别是对于金属系统。 尽管对再结晶进行了大量的研究，但由于难以定量和准确地表征材料的变形状态，该过程的许多细节仍然不清楚;这种状态可以被认为是前体状态，为随后的退火过程奠定了基础，因此理解这种状态至关重要。 从变形的样品中提取晶格应变是具有挑战性的，但需要重新关注，由于最近的电子背散射衍射（EBSD）检测器系统的改进。 一个基于物理的EBSD预测模型相结合的能力，将局部变形张量的模式生成算法。特别是在较低的显微镜加速电压下，即，低于10 kV，有可能提高EBSD测量的空间分辨率到几十纳米，特别是当与灵敏的直接电子探测器结合使用时。 EBSD图案与变形晶格的真实模拟图案的整体图案匹配使得在大样品区域上常规地达到优于0.0001的应变灵敏度成为可能。 拟议的研究包括计算模型开发和现场实验工作的紧密结合。 这项工作的一部分是与UCSB和约翰霍普金斯大学的同事合作进行的。 所有算法都以同行评审的出版物和开源代码的形式提供给社区。在教育方面，OpenChapters项目通过创建一个开源机制，通过众包方式生成免费教科书，解决了材料科学和工程教科书成本迅速上升的问题。该奖项反映了NSF的法定使命，并通过使用基金会的知识价值和更广泛的影响审查标准进行评估，被认为值得支持。