Development of a Dual-Probe Scanning Tunneling Microscope for Investigating Nanoscale Materials and Devices

开发用于研究纳米级材料和器件的双探头扫描隧道显微镜

• 批准号: 9522221
• 负责人: John Boland
• 金额: $ 18.64万
• 依托单位: University of North Carolina at Chapel Hill
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1995
• 资助国家: 美国
• 起止时间: 1995-09-01 至 1998-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9522221&HistoricalAwards=false
• 关键词: Development; Dual; Probe; Scanning; Tunneling

9522221 Boland This award provides funds to develop a dual-probe scanning tunneling microscope (DP-STM) to investigate nanoscale material and device properties. DP-STM is essentially identical to conventional single probe STM except that it enables two independent STM probes to be positioned 10-100nm from each other. This capability will be achieved by the controlled growth of nanowhiskers on each STM probe. A method is described to reliably position the whiskered probes within the prescribed separation. In contrast to conventional STM which can only measure local static properties of materials, DP-STM opens up whole new areas of investigation, particularly in the area of non-local dynamical and relaxation phenomena. By selecting the locations of the STM probes it is possible to measure transport and surface band dispersion along any particular direction in the material. A variety of novel pump- probe experiments are also possible. For instance, it is possible to measure how charge injection at a particular location affects the electrostatic potential and density of states at some nearby location. The latter is particularly interesting since it amounts to a fundamental description of the local chemical reactivity. DP-STM also represents a potentially powerfully technique to probe the characteristics and performance of nanodevices. ***

该奖项为开发双探针扫描隧道显微镜（DP-STM）提供资金，用于研究纳米级材料和器件的特性。DP-STM基本上与传统的单探针STM相同，除了它使两个独立的STM探针能够彼此定位10-100nm。这种能力将通过在每个STM探针上控制纳米晶须的生长来实现。描述了在规定的分离范围内可靠地定位须状探针的方法。与传统STM只能测量材料的局部静态特性相比，DP-STM开辟了全新的研究领域，特别是在非局部动力和弛豫现象领域。通过选择STM探针的位置，可以测量材料中沿任何特定方向的输运和表面带色散。各种新颖的泵-探针实验也成为可能。例如，可以测量在特定位置的电荷注入如何影响附近某个位置的静电势和状态密度。后者特别有趣，因为它相当于对局部化学反应性的基本描述。DP-STM也代表了一种潜在的强有力的技术来探测纳米器件的特性和性能。＊＊＊