Microtexture Analysis System Using Electron Backscatter Patterns

9523050约翰逊这个学术研究基础设施(发展)奖是为了部分资助使用电子背向散射图案的微结构分析系统的开发。新的EBSP系统将用于各种领域的研究，如断裂起始、再结晶和多相变形。这一系统将允许完全确定微观结构和局部颗粒，完全确定多晶材料的微观结构和局部颗粒取向，分辨率在微米量级。EBSP技术的基础是将一束狭窄的电子束聚焦在材料的一个非常小的样本上，并探测这一区域，以产生一种被称为菊池模式的亮带和暗带图案。这种图案可以被识别并归因于材料中的晶格平面。根据这一鉴定，确定了局部晶体取向。***

9523050 Johnson This Academic Research Infrastructure (Development) Award is made to partially fund the development of a Microstructure Analysis System using electron backscatter patterns (EBSP). The new EBSP system will be used for research in a variety of areas such as fracture initiation, recrystallization and polyphase deformations. This system will permit the complete determination of both the microstructure and local grain the complete determination of both the microstructure and local grain orientations of polycrystalline materials with a resolution on the order of microns. The basis of the EBSP technique is to focus a narrow beam of electrons on a very small sample of the material and probe this region to produce a pattern of light and dark bands known as the Kikuchi pattern. The pattern can be identified and attributed to lattice plans in the material. From this identification, the local crystal orientation is determined. ***