Engineering Research Equipment: Analytical Probes for In Situ Characterization of an Ultrahigh Vacuum Thin Film Desposition Reactor
Engineering Research Equipment: Analytical Probes for In Situ Characterization of an Ultrahigh Vacuum Thin Film Desposition Reactor
批准号:
9610123
负责人:
James Engstrom
金额:
$2.8万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1997
资助国家:
美国
项目状态:
已结题
起止时间:
1997-06-01 至 2000-05-31
中文摘要
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英文摘要
ABSTRACT Proposal Number: CTS-9610123 Principal Investigator: James R. Engstrom Institution: Cornell University Probes for an existing UHV reactor dedicated to semiconductor thin-film deposition will be purchased. They will include: a quadrupole mass spectrometer with molecular-beam compatible cross-beam ionizer and negative or positive ion detection capability: a translation stage for sample positioning; a refrigeration trap for the quadrupole mass spectrometer; a lock-in amplifier for reverse-view LEED or retarding-field Auger spectroscopy; and accessories.
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NIRT: Nanoscale Engineering of Inorganic-Organic Interfaces: Applications to Molecular Scale Electronics
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批准号:0210693
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项目类别:Continuing Grant
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资助金额:$0.0万
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财政年份:2002
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负责人:James Engstrom
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依托单位:
GOALI: Industry/University Cooperative Research Project: Development of a Novel Thin Film Deposition Process: A Combined Experimental and Computer Simulation Study
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批准号:9500817
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项目类别:Continuing Grant
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资助金额:$29.84万
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财政年份:1995
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负责人:James Engstrom
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依托单位:
Presidential Young Investigator Award: The Surface Chemistry of Gas-Solid Materials Processing
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批准号:9157892
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项目类别:Continuing Grant
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资助金额:$31.25万
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财政年份:1991
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负责人:James Engstrom
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依托单位:
Surface Chemical Dynamics and Kinetics at the Gas-Solid Epitazial Growth Interface
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批准号:9010561
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项目类别:Standard Grant
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资助金额:$7.0万
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财政年份:1990
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负责人:James Engstrom
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依托单位:
国内基金
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