Development of Nanoscale Strain Mapping Instrumentation

该奖项用于开发用于晶体固体定量应变测量的仪器，其目标是10nm的横向空间分辨率和10-4的应变灵敏度，并具有在该分辨率下并发的成分和微观结构映射能力。该仪器将把x射线衍射提高到通常与扫描或透射电子显微镜相关的空间分辨率范围。纳米级x射线衍射将采用白光同步辐射准直并通过锥形玻璃毛细管进行浓缩。来自单个颗粒的劳厄衍射图案将用基于ccd的区域检测器进行检查。单粒内的应变将使用Si（Li）探测器从晶格参数测量中确定，仔细注意相关电子器件的稳定性，并在探测器输出中最佳地拟合能量峰，以确定x射线光子能量。该仪器所提供的能力对于理解纳米材料的性质至关重要。理解量子阱结构的光学性质、纳米机器的力学性质以及纳米复合材料的强度和韧性需要在纳米尺度上对应变进行定量测量。

9625887 Cargill This award is for the development of instrumentation for quantitative strain measurements in crystalline solids with the goal of 10nm lateral spatial resolution and 10-4 strain sensitivity, with concurrent composition and microstructure mapping capabilities at this resolution. This instrument will advance x-ray diffraction to the range of spatial resolution usually associated with scanning or transmission electron microscopy. Nanoscale x-ray diffraction will employ white beam synchrotron radiation collimated and concentrated by a tapered glass capillary. Laue diffraction patterns from single grains will be examined with a CCD-based area detector. Strains within single grains will be determined from lattice parameter measurements using an Si(Li) detector, with careful attention to stability of associated electronics and to optimally fitting energy peaks in the detector output to determine x-ray photon energies. %%% The capabilities to be provided by this instrument are critically important in understanding the properties of nanofarbricated materials. Understanding the optical properties of quantum well-based structures, the mechanical properties of nanomachines, and the strength and toughness of nanocomposites require quantitative measurements of strain on the nanometer scale.