Acquisition and Development of X-Ray Instrumentation for the Study of Nanostructured Materials and Thin Films

用于纳米结构材料和薄膜研究的 X 射线仪器的购置和开发

• 批准号: 9625965
• 负责人: Luz Martinez-Miranda
• 金额: $ 11.26万
• 依托单位: University of Maryland, College Park
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1996
• 资助国家: 美国
• 起止时间: 1996-09-01 至 1999-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9625965&HistoricalAwards=false
• 关键词: Acquisition; Development; Ray; Instrumentation; Study

9625965 Martinez-Miranda The properties of very thin films often deviate from the bulk due to confinement and surface energy effects. The deviation from bulk properties depends on parameters such as film thickness, strain and processing conditions and these variations can depend on the depth within the film. Many advances in thin film processes are the result of advances in the techniques used to characterize these materials. The development of high intensity x-ray sources has made possible in-house studies of aggregate samples, quasi- ordered materials, very small samples and thin films. Currently in the Materials and Nuclear Engineering Department at the University of Maryland there are a range of problems being studied which depend on the characterization of structure in the nanometer size scale. This award provides support for the purchase of an 18 kW rotating anode x-ray source and the construction of a small angle x-ray scattering (SAXS) diffractometer. The two ports on the rotating anode source would be used for the small angle diffractometer and for a thin film four circle diffractometer already available in the Department. This equipment will allow us to perform small angle analysis of thin film and bulk morphology in the size range of 1-100 nm and in-plane and depth profile analysis of thin films. %%% The on-going research problems which can be addressed immediately by the use of the four circle diffractometer would include: thin films of liquid crystals, semiconducting multilayers, films of metal aggregates and disordered clusters, polymer nanofoam dielectric films, and reactive polymer blend interfaces. In addition to many of the systems listed above, the SAXS system could be used immediately to solve current research problems in area of: structure of metal aggregates and clusters, structure of highly branched dendrimer molecules and characterization of reactive polymer blends. All of these research areas are current projects in the Dep artment where the application of x-ray scattering techniques would have a dramatic and substantial impact on solving outstanding structural characterization and application problems in the fields of electronic devices, optical display devices and polymer blends. ***

9625965 Martinez-Miranda 由于限制和表面能效应，非常薄的薄膜的特性常常与大块薄膜的特性不同。 与整体特性的偏差取决于薄膜厚度、应变和加工条件等参数，并且这些变化可能取决于薄膜内的深度。 薄膜工艺的许多进步都是用于表征这些材料的技术进步的结果。 高强度 X 射线源的发展使得对聚合样品、准有序材料、非常小的样品和薄膜的内部研究成为可能。 目前，马里兰大学材料与核工程系正在研究一系列取决于纳米尺度结构表征的问题。 该奖项为购买 18 kW 旋转阳极 X 射线源和建造小角度 X 射线散射 (SAXS) 衍射仪提供支持。 旋转阳极源上的两个端口将用于小角度衍射仪和该部门已有的薄膜四圆衍射仪。 该设备将使我们能够对尺寸范围为 1-100 nm 的薄膜和体形貌进行小角度分析，并对薄膜进行面内和深度剖面分析。 %%% 使用四圆衍射仪可以立即解决的正在进行的研究问题包括：液晶薄膜、半导体多层膜、金属聚集体和无序簇薄膜、聚合物纳米泡沫介电薄膜和反应性聚合物共混物界面。 除了上面列出的许多系统之外，SAXS 系统还可以立即用于解决以下领域的当前研究问题：金属聚集体和簇的结构、高度支化的树枝状聚合物分子的结构以及反应性聚合物共混物的表征。 所有这些研究领域都是该部门当前的项目，其中X射线散射技术的应用将对解决电子器件、光学显示器件和聚合物共混物领域中突出的结构表征和应用问题产生巨大而实质性的影响。 ***