Near-Field Scanning Optical Microscopy Study of Polycrystalline Semiconductors

9704780柯林斯这个项目的目的是提高多晶材料的理解，特别是砷化镓和碲化镉的这项研究，通过微观调查的个别晶粒，晶界和界面，以及表面钝化处理对这些功能的影响。该方法的关键组成部分涉及使用近场扫描光学显微镜（NSOM）传输，沿着与光电流，光致发光和少数载流子寿命测量。该项目解决了与电子和光子学技术相关的材料科学专题领域的基础研究问题。 这项研究将为多晶材料的基础材料科学知识做出贡献。 此外，从研究中获得的基础知识和理解有望通过提供更好的理解和生产改进材料和材料组合的基础，有助于提高这些材料在各种应用中的性能。 该计划的一个重要特点是通过在具有较强技术相关性的研究领域培养学生来整合研究和教育。***

9704780 Collins This project aims to improve understanding of polycrystalline materials, specifically GaAs and CdTe for this study, through microscopic investigations of individual grains, grain boundaries, and interfaces, and the effects of surface passivation treatments on these features. The key component of the approach involves the use of near field scanning optical microscopy(NSOM) transmission, along with photocurrent, photoluminescence and minority carrier lifetime measurements. %%% The project addresses basic research issues in a topical area of materials science having technological relevance to electronics and photonics. The research will contribute basic materials science knowledge at a fundamental level to polycrystalline materials. Additionally, the fundamental knowledge and understanding gained from the research is expected to contribute to improving the performance of these materials in a variety of applications by providing a better understanding and a basis for producing improved materials, and materials combinations. An important feature of the program is the integration of research and education through the training of students in a research area with strong technological relevance. ***