Near-Field Scanning Optical Microscopy Study of Polycrystalline Semiconductors

9704780柯林斯这个项目旨在通过对单个颗粒、晶界和界面的微观研究，以及表面钝化处理对这些特性的影响，来提高对多晶材料，特别是本研究中的砷化镓和镉的理解。该方法的关键部分包括使用近场扫描光学显微镜(NSOM)传输，以及光电流、光致发光和少数载流子寿命测量。该项目致力于解决材料科学中与电子学和光子学相关的技术领域的基础研究问题。这项研究将在基础水平上为多晶材料贡献基础材料科学知识。此外，从研究中获得的基本知识和理解有望通过为生产改进的材料和材料组合提供更好的理解和基础，从而有助于提高这些材料在各种应用中的性能。该计划的一个重要特点是，通过在具有很强技术相关性的研究领域培训学生，将研究和教育相结合。***

9704780 Collins This project aims to improve understanding of polycrystalline materials, specifically GaAs and CdTe for this study, through microscopic investigations of individual grains, grain boundaries, and interfaces, and the effects of surface passivation treatments on these features. The key component of the approach involves the use of near field scanning optical microscopy(NSOM) transmission, along with photocurrent, photoluminescence and minority carrier lifetime measurements. %%% The project addresses basic research issues in a topical area of materials science having technological relevance to electronics and photonics. The research will contribute basic materials science knowledge at a fundamental level to polycrystalline materials. Additionally, the fundamental knowledge and understanding gained from the research is expected to contribute to improving the performance of these materials in a variety of applications by providing a better understanding and a basis for producing improved materials, and materials combinations. An important feature of the program is the integration of research and education through the training of students in a research area with strong technological relevance. ***