Built-In Test Mechanisms and Embedded Cores

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9815229This project is a cooperative between the University of Arizona (Tragoudas) and Southern illinois University at Carbondale (Kagaris).This project is exploring a framework for designing easily testable cores. The method is based on the ability to identify disjoint components in the core, called CCs (core components),for which no implementation details are released. Netlist information is provided for the remaining portion of the core. The CCs must guarantee that the predesigned intellectual property of the core is protected and that the testing process is simplified. Functional faults are detected by initially testing each CC in isolation using either Built-In Self-Testing (BIST) or scan techniques. Subsequently, the remaining portion of the core is tested using scan techniques while bypassing the CCs. Path delay faults may require functional level testing for the selected CCs. Problems being investigated are: (1) Determining the number, sizes, locations of the CCs, and the type of Built-In Test mechanism within each CC. (2) Developing BIST schemes and DFT methodologies that assist in generating the CCs within the core.