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RIA: Built-In Test Pattern Generation Methods

RIA: Built-In Test Pattern Generation Methods
RIA：内置测试模式生成方法
批准号：
9409905
负责人：
Spyros Tragoudas
金额：
$10.0万
依托单位：
Southern Illinois University at Carbondale
依托单位国家：
美国
项目类别：
Standard Grant
财政年份：
1994
资助国家：
美国
项目状态：
已结题
起止时间：
1994-07-01 至 1997-12-31
来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=9409905&HistoricalAwards=false
关键词：
RIABuiltTestPatternGeneration

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英文摘要
This research is on the design of test pattern generators for combinational circuits. Various schemes for LSFR/SR pseudorandom test pattern generators are being examined. The focus is on finding high quality ATPG algorithms that require minimal hardware overhead. Several families of not-necessarily primitive, characteristic polynomials are being investigated with the objective of guaranteeing that test patterns will be applied randomly to all outputs. In addition, various partial scan schemes that follow the structural approach are being studied.
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