Microscopic Mechanisms of III-Nitride Growth
Microscopic Mechanisms of III-Nitride Growth
批准号:
0074675
负责人:
Philip Cohen
金额:
$38.69万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2000
资助国家:
美国
项目状态:
已结题
起止时间:
2000-08-15 至 2004-07-31
中文摘要
该项目致力于更好地了解III-氮化物生长所涉及的主要微观过程。该方法结合了高温扫描隧道显微镜、反射高能电子衍射和解吸质谱学。我们将寻求一种可预测的增长模式。将开发速率方程模型和动力学蒙特卡罗模型(与其他机构合作)。需要解决的重要问题是可以使用的GaN表面的极性和结构的差异,生长参数的作用,以及缺陷的作用。将研究对III-氮化物的生长进行微观控制的方法。%该项目解决材料科学的一个具有高度技术相关性的主题领域的基础研究问题。现在可以使用实验工具对基本的表面过程进行原子水平的观察,如果更好地了解这些过程,就可以推动基础科学和技术的进步。这项工作的结果可能会使材料生长的可靠控制达到一个新的水平,使具有可重复性的半导体器件能够在各种学术和商业环境中获得。该计划的一个重要特点是通过在一个具有根本意义和技术意义的领域对学生进行培训,将研究和教育结合起来。***
英文摘要
This project strives for greater understanding of the primary microscopic processes involved in the growth of III-nitrides. The approach incorporated high temperature scanning tunneling microscopy, reflection high energy electron diffraction and desorption mass spectroscopy. A predictive growth model will be sought. Rate equation models and kinetic Monte Carlo models (in collaboration with others) will be developed. Important issues to be addressed will be the differences in polarity and structure of the GaN surfaces that can be used, the role of growth parameters, and the role of defects. Methods to exert microscopic control over the growth of III-nitrides will be investigated.%%% The project addresses basic research issues in a topical area of materials science with high technological relevance. Experimental tools are now available to allow atomic level observation of elementary surface processes which when better understood allow advances in fundamental science and technology. The results of this work may allow a new level of reliable control of materials growth, allowing semiconductor devices with reproducible properties to be attained in a variety of academic and commercial settings. An important feature of the program is the integration of research and education through the training of students in a fundamentally and technologically significant area. ***
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Management Matters: Consequences of Managerial Composition
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U.S.-Japan Seminar: Surface Characterization by Electron Diffraction, REM, and Holography/March 1993/Honolulu, Hawaii
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批准号:9116623
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The Role of Defects in Epitaxy
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Reflection High Energy Electron Diffraction Equipment
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财政年份:1990
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Diffraction Studies of Epitaxy
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批准号:8615207
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财政年份:1987
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依托单位:
Reflection High-Energy Electron Diffraction Studies of Epitaxial Growth (Materials Research)
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负责人:Philip Cohen
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依托单位:
国内基金
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