MRI: Acquisition of a Field Emission Transmission Electron Microscope

MRI：购买场发射透射电子显微镜

• 批准号: 0216466
• 负责人: James Speck
• 金额: $ 70万
• 依托单位: University of California-Santa Barbara
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2002
• 资助国家: 美国
• 起止时间: 2002-09-01 至 2004-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0216466&HistoricalAwards=false
• 关键词: MRI; Acquisition; Field; Emission; Transmission

This award from the Major Research Instrumentation program supports the University of California at Santa Barbara with the acquisition of a state-of-the-art field emission transmission electron microscope (FE-TEM) with capabilities for atomic resolution Z-contrast imaging and spectroscopy. The instrument is crucial to meet needs in ongoing and future research projects in electronic, inorganic, and structural materials, UCSB proposes the acquisition. The needs of the research can be fulfilled with a 200 kV TEM/STEM equipped with a field emission source, high angle annular dark field detector, a 2Kx2K CCD detector, and state-of-the-art electron spectrometer/energy filter. Z-contrast imaging and atomic resolution spectroscopy have been routinely demonstrated on the instrument with a 1.4 Angstrom probe size, 20 picoAmpere beam current, and energy resolution of ~0.7 electron Volts. The acquisition of the proposed FE-TEM will free an existing conventional 200 kV TEM for studies of soft materials. The acquisition of the new FE-TEM will strengthen the education of students in advanced TEM. Graduate students and post-doctoral researchers are the primary 'hands-on' users of TEM at UCSB. Formal training in TEM is provided in a series of courses is offered in the Materials Department. A new course in advanced TEM that reflects the unique capabilities of a FE-TEM will be offered. The advanced TEM course will include a lab module to provide hands-on training in high-resolution imaging in CTEM and in STEM and in advanced analytical techniques, such as electron energy-loss spectroscopy. Through the Outreach program of the MRSEC, the scientists will work with high school teachers on TEM sample preparation and imaging and thus teach and connect to a broad community of students and teachers.To meet needs in ongoing and future research projects in advanced electronic, inorganic, and structural materials, UCSB will acquire a state-of-the-art field emission transmission electron microscope (FE-TEM). Such an instrument produces an atomic scale electron probe. This sub-nanometer probe (~2 x 10-10 meters) can be used to image individual atoms and atomic columns with direct information on structure, composition, and bonding. An advanced FE-TEM provides a unique combination of atomic-scale information that is essential for the advancement of nanoscience and nanotechnology.Graduate students and post-doctoral researchers are the primary 'hands-on' users of TEM at UCSB. Formal training in TEM is provided in a series of courses offered in the Materials Dept. The new FE-TEM will strengthen the education of students in advanced TEM. A new course in advanced TEM that reflects the unique capabilities of a FE-TEM will be offered. The advanced TEM course will include hands-on training in high-resolution imaging in CTEM and in STEM and in advanced analytical techniques, such as electron energy-loss spectroscopy. Through the Outreach program of the MRSEC, UCSB scientists will work with high school teachers on TEM sample preparation and imaging and thus teach and connect to a broad community of students and teachers.

该奖项来自主要研究仪器项目，支持加州大学圣巴巴拉分校获得最先进的场发射透射电子显微镜（FE-TEM），具有原子分辨率z对比成像和光谱学能力。UCSB提议收购该仪器，该仪器对于满足正在进行和未来的电子、无机和结构材料研究项目的需求至关重要。配备场发射源、高角度环形暗场探测器、2Kx2K CCD探测器和最先进的电子能谱仪/能量滤波器的200 kV TEM/STEM可以满足研究需求。z对比成像和原子分辨率光谱已经在仪器上进行了常规演示，探针尺寸为1.4埃，光束电流为20皮安，能量分辨率为~0.7电子伏特。获得拟议的FE-TEM将使现有的传统200 kV TEM用于软材料的研究。引进新的华东师范大学专业技术学院将加强对学生的高级专业技术教育。在UCSB，研究生和博士后研究人员是TEM的主要“实际”用户。在物料部的一系列课程中提供TEM的正式培训。将开设一门反映FE-TEM独特能力的高级TEM新课程。高级TEM课程将包括一个实验室模块，提供CTEM和STEM的高分辨率成像以及电子能量损失光谱等高级分析技术的实践培训。通过MRSEC的外展计划，科学家们将与高中教师合作进行TEM样品制备和成像，从而与广泛的学生和教师社区进行教学和联系。为了满足正在进行和未来的先进电子，无机和结构材料研究项目的需求，UCSB将获得最先进的场发射透射电子显微镜（FE-TEM）。这种仪器可以产生原子尺度的电子探针。这种亚纳米探针（~2 × 10-10米）可用于对单个原子和原子柱进行成像，从而获得结构、组成和键合的直接信息。先进的FE-TEM提供了原子尺度信息的独特组合，这对纳米科学和纳米技术的进步至关重要。在UCSB，研究生和博士后研究人员是TEM的主要“实际”用户。材料部开设了一系列正式的专业技术培训课程。新成立的FE-TEM将加强对学生的高级专业技术教育。将开设一门反映FE-TEM独特能力的高级TEM新课程。高级TEM课程将包括CTEM和STEM的高分辨率成像以及电子能量损失光谱等高级分析技术的实践培训。通过MRSEC的外展计划，UCSB的科学家将与高中教师合作进行TEM样品制备和成像，从而教授并连接到广泛的学生和教师社区。