Acquisition of a Low Temperature Near-Field Scanning Optical Microscope/Scanning Probe Microscope (NSOM/SPM) for Spectroscopic Studies of Structures Down to the Nanometer-Scale

该奖项来自材料研究仪器计划，用于收购低温近场扫描光学显微镜/扫描探针显微镜（NSOM/SPM），用于纳米尺度结构的光发射光谱研究。这样一个强大的组合将允许同时记录的地形和光谱数据，与传统的远场成像，共焦显微镜，原子力显微镜（AFM），和近场光学在一个单一的系统。例子包括纳米线阵列、量子点和相关III-V族和磁性半导体异质结构的NSOM成像/光谱，无序聚合物、玻璃、过冷液体的NSOM荧光，以及蛋白质的单分子荧光研究。还提出了新的实验，探索在光波长的量子混沌问题，使用适当的制造结构。Nanonics Imaging Ltd.的NSOM/SPM-100共焦系统能够同时进行NSOM和AFM成像。金属涂层的尖端将用于半导体样品的弹道电子发射显微镜的发展，同时与光发射光谱。该仪器有可能满足许多不同的用户，包括确定和建设本科生和研究生的基本技能，并培养有才华的技术人员。它将成为超高真空扫描隧道显微镜（STM/AFM）和目前在东北大学物理系提供的显微拉曼系统的补充工具，这些系统致力于促进纳米和生物分子科学的研究和教育计划。这是一个仪器奖东北大学的近场扫描光学显微镜/扫描探针显微镜（NSOM/SPM）与分析光发射光谱（LES）的能力。新设施为其他几种形式的前沿显微镜的通用集成提供了一个免费的平台，例如超高真空扫描隧道显微镜/原子力显微镜和显微拉曼系统，这些系统目前正在物理系中使用。该仪器将使用户能够直接比较样品的形貌和光学/光谱特性，直到纳米尺度。该仪器具有从室温到10 K的变温能力，并建议未来发展使用金属涂层尖端的弹道电子发射光谱（BEES），用于半导体异质结构的互补BEES/LES研究。该设施有两个中心目标：1）利用NSOM成像/光谱进行合作研究，探索光波段量子混沌问题;量子点和磁性半导体“自旋电子”应用的研究;无序聚合物、玻璃的NSOM荧光;蛋白质的单分子荧光研究。2）本科生、研究生和有才华的技术人员在纳米尺度表征技术方面的教育和实践培训。仪器要求包括东北大学提供的33%配套资金和仪器制造商的大幅折扣。

This award from the Instrumentation for Materials Research program is for the acquisition of a low temperature Near-field Scanning Optical Microscope/Scanning Probe Microscope (NSOM/SPM) for light emission spectroscopic studies of structures down to the nanometer-scale. Such a powerful combination will allow the simultaneous recording of topographical and spectroscopic data, with conventional far-field imaging, confocal microscopy, atomic force microscopy (AFM), and near-field optics in a single system. Examples include NSOM imaging/spectroscopy of nanowire arrays, quantum dots, and related III-V and magnetic semiconductor heterostructures, NSOM fluorescence of disordered polymers, glasses, super-cooled liquids, and single molecule fluorescence studies of proteins. Novel experiments are also proposed to explore issues in quantum chaos at optical wavelengths using suitably fabricated structures. The Nanonics Imaging Ltd. NSOM/SPM-100 confocal system is able to perform simultaneous NSOM and AFM imaging. Metal-coated tips will be used for the development of ballistic electron emission microscopy of semiconductor samples simultaneously with light emission spectroscopy. The instrument has the potential of satisfying many diverse users including identifying and building basic skill sets for undergraduate and graduate students and to train talented technicians. It will be a complementary tool to the ultra high vacuum Scanning Tunneling Microscope (STM/AFM) and a micro-Raman systems currently available in the physics department at Northeastern University that are devoted to the promotion of research and educational programs in nano- and biomolecular-science. This is an instrument award to Northeastern University for a Near-field Scanning Optical Microscope/Scanning Probe Microscope (NSOM/SPM) with analytical light emission spectroscopic (LES) capabilities. The new facility provides a complimentary platform for the universal integration of several other forms of frontier microscopies, such as an ultra high vacuum scanning tunneling microscope/atomic force microscope and micro-Raman systems, that are currently in use in their physics department today. The instrumentation will enable the user to make direct comparisons between the topographical and optical/spectroscopic properties of samples down to the nanometer scale. The instrument is equipped with a variable temperature capability from room temperature to10K and the proposal calls for future development of ballistic electron emission spectroscopy (BEES) using metal-coated tips for complementary BEES/LES studies of semiconductor heterostructures.The facility has two central goals: 1) Collaborative research using NSOM imaging/spectroscopy to explore issues in quantum chaos at optical wavelengths; studies of quantum dots, and magnetic semiconductors for "spintronic" applications; and NSOM fluorescence of disordered polymers, glasses; and single molecule fluorescence studies of proteins.2) Education and hands-on training of undergraduate students, graduate students, and talented technicians in nanometer-scale characterization techniques. The instrument request includes 33% matching funds provided by Northeastern University and a substantial discount by the instrument manufactures.