NER: Synthesis of Nanoscale Structures of New Direct Bandgap Semiconductors
NER: Synthesis of Nanoscale Structures of New Direct Bandgap Semiconductors
批准号:
0304362
负责人:
John Kouvetakis
金额:
$10.0万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2003
资助国家:
美国
项目状态:
已结题
起止时间:
2003-09-01 至 2005-08-31
中文摘要
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英文摘要
We propose to conduct exploratory research on the fabrication of self-assembled nanometer-scale structures of new classes of semiconductors with direct tunable bandgaps in the UV/visible and infrared spectral regions.A major part of the work will focus on the growth of nanoscale sized structures of a completely new semiconductor system in the XCZN family where X is a group IV element (Si, Ge, Sn) and Z is a group III metal (Al, Ga, In). Specifically, these structures are quantum dots and pillars of the quaternary wideband gap material (GeC) 1-x (GaN) x with an adjustable bandgap between 1.6 and 3.3 eV. These materials are created directly on Si via suitable buffer layers utilizing the vapor-liquid-solid (VLS) mechanism, which provides flexibility of fine-tuning the size and spatial distributions of the nanostructures. An important objective of this work is to integrate (GeC) 1-x(GaN)x and related optical alloys with Si technologies so that their full potential can be realized as commercially viable materials.The research program also covers the synthesis of infrared nanostructures in the Si-Ge-Sn system with tunable electronic and structural properties. These materials include Ge1-xSnx quantum dots as well as related (SiGe) 1-xSnx and (Si4Ge) 1-xSnx nanostructures created directly on silicon substrates. The novelty in this case is the direct-bandgap nature of these Si-based systems. The electronic structure and optical properties will be thoroughly studied by spectroscopic ellipsometry, Raman microprobe, photoluminescence, cathodoluminescence, transmission IR spectroscopy and electron energy loss spectroscopy. Structural characterization involving high resolution electron microscopy, ion channeling (RBS), high resolution x-ray diffraction, low energy electron microscopy (LEEM) and atomic force microscopy are used extensively to provide rapid feedback about the quality of the structure and morphology of the nanostructures, thus ultimately leading to better design of the synthetic pathways.The broader impact of the proposed activity is to benefit undergraduates in chemistry, physics and materials science, by involving them in the research and discovery process of creating novel nanostructures of new and useful semiconductor materials. These students, including members of underrepresented groups, will also be exposed to the industrial environment at local microelectronic and optoelectronic laboratories in order to gain first-hand knowledge and an in-depth appreciation of the technical innovations in semiconductor and nanoscience research
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批准号:0526604
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项目类别:Standard Grant
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资助金额:$24.5万
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财政年份:2005
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负责人:John Kouvetakis
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依托单位:
Acquisition of an Infrared Ellipsometer for Materials Research and Student Training
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批准号:0315760
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资助金额:$15.0万
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负责人:John Kouvetakis
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依托单位:
Synthetic Routes to Main-Group Inorganic Solids
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批准号:0221993
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项目类别:Continuing Grant
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资助金额:$35.07万
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财政年份:2002
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负责人:John Kouvetakis
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依托单位:
Novel Synthetic Routes to Main Group Inorganic Solids
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批准号:9902417
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项目类别:Continuing Grant
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资助金额:$30.32万
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财政年份:1999
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负责人:John Kouvetakis
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依托单位:
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批准号:9619834
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项目类别:Continuing Grant
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资助金额:$13.2万
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财政年份:1997
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负责人:John Kouvetakis
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依托单位:
NSF Young Investigator
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批准号:9458047
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项目类别:Continuing Grant
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资助金额:$31.25万
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财政年份:1994
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负责人:John Kouvetakis
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依托单位:
国内基金
海外基金
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批准号:61671111
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项目类别:面上项目
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资助金额:58.0万元
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批准年份:2016
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负责人:肖飞
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依托单位: