Acquisition of a Scanning Probe System for Characterization of Nanostructure Properties

这笔赠款为购买多用途超高真空扫描隧道显微镜（UHV）STM-AFM提供资金，该显微镜具有完整的光谱功能，温度范围可延伸至25K。这种设备对于许多纳米科学研究至关重要。该系统包括制造商和研究人员提供的几个独特的升级。包括先进的表面制备、纳米结构形成和表面表征能力。STM-AFM将用于研究探索量子点和线电子学和纳米级肖特基势垒，分子自组装纳米结构中的量子效应，原子定制表面上的选择性反应，纳米级摩擦化学，纳米晶体半导体，压电和铁电纳米图案化薄膜，氮化物纳米结构的光发射以及光诱导传输效应。扫描探针系统在纳米尺度上测量材料特性的能力是独一无二的。STM本身是基于量子力学隧穿来构建具有原子尺度分辨率的图像。当与扫描隧道光谱技术相结合时，STM的价值大大增加。表面的图像可以从原子尺度上的吸引力和排斥力之间的相互作用尖锐的尖端和表面构建。这种技术，被称为原子力显微镜（AFM），大大增强了与电测量耦合通过尖端在同一时间的地形成像记录。变温扫描探针系统将与另外两个扫描探针系统集成，以建立一个纳米结构特性表征实验室。该实验室每年将为30多名学生和博士后研究人员提供参与纳米科学研究的研究和探索性教育项目的机会。此外，从实验室的结果将直接纳入研究生和本科课程，现在正在提供北卡罗来纳州。PI一直积极通过从代表性不足的群体中招募研究生，参与北卡罗来纳州REU计划（该计划具有多样化学生参与的传统），以及通过与附近的北卡罗来纳州中央大学和邵氏大学（HBCU）的教师合作，来建立多样性。

This grant provides funding for the acquisition of a multipurpose ultra high vacuum scanning tunneling microscope (UHV) STM-AFM with full spectroscopic capabilities and a temperature range extending down to 25K. This equipment is critical for a multitude of nanoscience studies. The system includes several unique upgrades provided by both the manufacturer and the researchers. Included are advanced surface preparation, nanostructure formation, and surface characterization capabilities. The STM-AFM will be used in research to explore quantum dot and wire electronics and nanoscale Schottky barriers, quantum effects in molecular self-assembled nanostructures, selective reactions on atomically tailored surfaces, tribochemistry at the nanoscale, nanocrystalline semiconductors, piezoelectric and ferroelectric nanopatterned films, optical emission from nitride nanostructures, and light-induced transport effects. Scanning probe systems are unique in their ability to measure materials properties at the nanometer scale. The STM is itself based on quantum mechanical tunneling to construct images with atomic scale resolution. The value of STM is increased substantially when coupled with scanning tunneling spectroscopy techniques. Images of surfaces can be constructed from the atomic scale attractive and repulsive interactions between a sharp tip and a surface. This technique, termed atomic force microscopy (AFM), is substantially enhanced with electrical measurements coupled through the tip at the same time as topographic imaging is recorded. The variable temperature scanning probe system will be integrated with two other scanning probe systems to establish a laboratory for the Characterization of Nanostructure Properties. This laboratory will provide the opportunity for over thirty students and post doctoral researchers annually to be involved with research and exploratory education projects in nanoscience research. Moreover, results from the laboratory will be incorporated directly into graduate and undergraduate courses now being offered at NC State. The PIs have been active in building diversity through their recruiting of graduate students from underrepresented groups, their involvement in the NC State REU programs, which have a tradition of diverse student involvement, and through collaborations with faculty of nearby North Carolina Central University and Shaw University, both HBCUs.