MRI: Acquisition of a coupled optical and scanning probe microscopy facility for advanced materials research

pi将在科罗拉多矿业学院（CSM）创建一个具有独特先进材料研究能力的自我维持扫描探针显微镜（SPM）设施。该仪器要求包括一个原子力显微镜（AFM）和一个光学显微镜，用于在纳米尺度上同时成像和物理性质测量，用于可再生能源和生命科学领域的各种先进材料。拟议的设施是为多用户环境而设计的，将在共享使用的设施中运行，校园内的大多数部门以及我们的区域合作伙伴国家可再生能源实验室（NREL）和科罗拉多儿童医院（CHC）都将参与其中。pi将组织并举办一年一度的落基山扫描探针显微镜研讨会，以提供培训机会，并吸引我们在NREL和CHC的合作伙伴之外的新区域用户。本科生将通过我们现有的夏季REU课程介绍到SPM。pi将在科罗拉多矿业学院（CSM）创建一个具有独特先进材料研究能力的自我维持扫描探针显微镜（SPM）设施。该仪器要求包括一个原子力显微镜（AFM）和一个光学显微镜，用于在纳米尺度上同时成像和测量各种先进材料的物理性质。所提出的SPM设备的独特之处在于，它能够在设计的操作条件下（例如光伏的照明和生物的水合条件），以纳米级分辨率直接测量材料的电学和机械性能。在小长度尺度上测量界面物理性质对于开发用于可再生能源和生命科学的下一代材料至关重要。这个设施将把目前对这些复杂材料的经验认识转变为真正的科学。超越标准SPM模式（接触、轻叩、相位）的特定高级功能包括光学显微镜、电子/机械性能测量和环境控制。显微镜有助于快速识别感兴趣的特定区域，并使光学刺激能够获得与拓扑注册的光导率或荧光等特性。关键材料性能的空间分辨测量，如电导率、模量和粘弹性，可以作为温度、湿度和照明强度/波长的函数。

The PIs will create a self-sustaining scanning probe microscopy (SPM) facility with unique capabilities for advanced materials research at the Colorado School of Mines (CSM). This instrumentation request includes an atomic force microscope (AFM) coupled to an optical microscope for simultaneous imaging and physical properties measurements at the nanoscale for a wide range of advanced materials in renewable energy and life sciences. The proposed facility is designed for a multi-user environment and will be operated in a shared-use facility, with participation from the majority of departments across campus as well as our regional partners the National Renewable Energy Laboratory (NREL) and Children's Hospital Colorado (CHC). The PIs will organize and host an annual Rocky Mountain Scanning Probe Microscopy Workshop to provide training opportunities and attract new regional users to the facility beyond our partners at NREL and CHC. Undergraduates will be introduced to SPM through our existing summer REU programs. The PIs will create a self-sustaining scanning probe microscopy (SPM) facility with unique capabilities for advanced materials research at the Colorado School of Mines (CSM). This instrumentation request includes an atomic force microscope (AFM) coupled to an optical microscope for simultaneous imaging and physical properties measurements at the nanoscale for a wide range of advanced materials. The unique feature of the proposed SPM facility is its ability to measure electrical and mechanical properties of materials in direct registry with topography at nanoscale resolution under their designed operating conditions (e.g illumination of photovoltaics and hydrated conditions for biological). The measurement of interfacial physical properties at small length scales is essential to the development of the next generation of materials for renewable energy and life sciences. This facility will transform the current empirical understanding of these complex materials into true science. Specific advanced capabilities beyond standard SPM modes (contact, tapping, phase) include optical microscopy, electro/mechanical property measurement, and environmental control. The microscope facilitates quick identification of the specific region of interest and enables optical stimulation to obtain properties such as a photoconductivity or fluorescence in registry with topology. Spatially resolved measurements of critical material properties such as conductivity, modulus, and viscoelasticity can be made as a function of temperature, humidity, and illumination intensity/wavelength.