MRI: Acquisition of a coupled optical and scanning probe microscopy facility for advanced materials research

PI将创建一个自我维持的扫描探针显微镜(SPM)设施，具有在科罗拉多矿业学院(CSM)进行先进材料研究的独特能力。这一仪器要求包括与光学显微镜相连的原子力显微镜(AFM)，用于对可再生能源和生命科学中的各种先进材料进行纳米级的同时成像和物理性质测量。拟议的设施是为多用户环境而设计的，将在共享设施中运行，校园内的大多数部门以及我们的地区合作伙伴国家可再生能源实验室(NREL)和科罗拉多州儿童医院(CHC)都参与其中。PIS将组织和主办一年一度的落基山扫描探针显微镜研讨会，以提供培训机会，并吸引除我们在NREL和CHC的合作伙伴之外的新的地区用户使用该设施。本科生将通过我们现有的暑期REU项目被介绍给SPM。PI将创建一个自我维持的扫描探针显微镜(SPM)设施，具有在科罗拉多矿业学院(CSM)进行先进材料研究的独特能力。这一仪器要求包括与光学显微镜相连的原子力显微镜(AFM)，用于在纳米尺度上同时测量各种先进材料的成像和物理性质。拟议的扫描电子显微镜设施的独特之处在于，它能够在设计的操作条件下(例如，光伏的照明和生物的水合条件)，以纳米级的分辨率直接与地形记录材料的电气和机械性能。在小尺度上测量界面物理性质对于可再生能源和生命科学的下一代材料的发展至关重要。这一设施将把目前对这些复杂材料的经验理解转变为真正的科学。标准SPM模式(接触、攻丝、相位)之外的特定高级功能包括光学显微镜、电气/机械性能测量和环境控制。该显微镜有助于快速识别特定的感兴趣区域，并使光刺激能够获得与拓扑学相一致的诸如光电导性或荧光的性质。可以根据温度、湿度和光照强度/波长对关键材料属性进行空间分辨测量，如导电性、弹性和粘弹性。

The PIs will create a self-sustaining scanning probe microscopy (SPM) facility with unique capabilities for advanced materials research at the Colorado School of Mines (CSM). This instrumentation request includes an atomic force microscope (AFM) coupled to an optical microscope for simultaneous imaging and physical properties measurements at the nanoscale for a wide range of advanced materials in renewable energy and life sciences. The proposed facility is designed for a multi-user environment and will be operated in a shared-use facility, with participation from the majority of departments across campus as well as our regional partners the National Renewable Energy Laboratory (NREL) and Children's Hospital Colorado (CHC). The PIs will organize and host an annual Rocky Mountain Scanning Probe Microscopy Workshop to provide training opportunities and attract new regional users to the facility beyond our partners at NREL and CHC. Undergraduates will be introduced to SPM through our existing summer REU programs. The PIs will create a self-sustaining scanning probe microscopy (SPM) facility with unique capabilities for advanced materials research at the Colorado School of Mines (CSM). This instrumentation request includes an atomic force microscope (AFM) coupled to an optical microscope for simultaneous imaging and physical properties measurements at the nanoscale for a wide range of advanced materials. The unique feature of the proposed SPM facility is its ability to measure electrical and mechanical properties of materials in direct registry with topography at nanoscale resolution under their designed operating conditions (e.g illumination of photovoltaics and hydrated conditions for biological). The measurement of interfacial physical properties at small length scales is essential to the development of the next generation of materials for renewable energy and life sciences. This facility will transform the current empirical understanding of these complex materials into true science. Specific advanced capabilities beyond standard SPM modes (contact, tapping, phase) include optical microscopy, electro/mechanical property measurement, and environmental control. The microscope facilitates quick identification of the specific region of interest and enables optical stimulation to obtain properties such as a photoconductivity or fluorescence in registry with topology. Spatially resolved measurements of critical material properties such as conductivity, modulus, and viscoelasticity can be made as a function of temperature, humidity, and illumination intensity/wavelength.