NEAR-FIELD THERMAL RADIATION FROM A HEATED ATOMIC FORCE MICROSCOPE CANTILEVER TIP

PI建议在纳米尺度上研究辐射传输，特别关注扫描探针显微镜(SPM)悬臂尖端和其扫描表面之间的热传递过程。特别考虑的问题包括光子通过消逝模式和表面波的隧穿，例如等离子激元或声子极化子。为了克服与在受控的、靠近温度传感器的高度局部化热源的温度控制相关的实验障碍，PI将利用原子力显微镜(AFM)悬臂的最新进展，该悬臂具有集成的加热器和具有纳米级锐度的尖端。该项目的成功将提供对两个物体之间辐射能量交换的首次测量，两个物体之间的真空间隙从10 nm到1 nm。解决近场热传输中的复杂物理现象可能导致纳米级器件、材料和工艺的发展，这些器件、材料和工艺严重依赖于热传输。这项研究由化学和运输系统司的热运输和热加工计划提供支持。

The PI's propose to study radiative transport at the nanoscale, with particular focus on heat transfer processes between a scanning probe microscope (SPM) cantilever tip and the surface over which it scans. Special considerations include photon tunneling through evanescent modes and surfaces waves, such as plasmon or phonon polaritons. To overcome experimental obstacles associated with controlling the temperature of a highly localized heating source in controlled, close proximity to a temperature sensor, the PI's will utilize recent advances in atomic force microscope (AFM) cantilevers with integrated heaters and tips with nanometer-scale sharpness. Success in this project will offer the first measurement of radiative energy exchange between two objects separated by a vacuum gap from 10 nm down to 1 nm. Resolving complex physical phenomena in near-field thermal transport could lead to development of nanometer-scaled devices, materials, and process, which critically depend upon thermal transport. This research is being supported by the Thermal Transport and Thermal Processing Program of the Chemical and Transport Systems Division.