SGER: Hydrophobic Forces in Particle Adhesion

SGER：颗粒粘附中的疏水力

• 批准号: 0414019
• 负责人: Stephen Beaudoin
• 金额: $ 4万
• 依托单位: Purdue University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2004
• 资助国家: 美国
• 起止时间: 2004-03-01 至 2005-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0414019&HistoricalAwards=false
• 关键词: SGER; Hydrophobic; Forces; Particle; Adhesion

AbstractCTS-04014019S. Beaudoin, Purdue UniversityThe role of hydrophobic forces in particle adhesion to surfaces in aqueous environments is not adequately understood. There is a need for the collection of data that will allow the hydrophobic effect to be quantified, and also for the development of theory to describe this effect. In this proposed work, atomic force microscopy will be used to measure directly the adhesion between particles and substrates of interest in aqueous solutions. The roughness of the substrate and the roughness and geometry of the particles will be measured before and after the adhesion forces are measured. The elastic properties of the particles and substrates will also be determined. With this information, particle adhesion models developed in the Beaudoin lab at Arizona State University will be used to quantify the van der Waals (vdW) and electrostatic (ES) interaction forces acting in these systems. These models take into account the effects of deformation and nonuniform geometry and morphology on the adhesion. After the vdW and ES forces are evaluated, the remaining forces in these systems will be attributed primarily to hydrophobic phenomena. In this fashion, a systematic experimental investigation of the hydrophobic interaction force for a number of particles of different size and geometry interacting with a number of surfaces will be performed. Contact angle measurements will be performed on flat sheets of material with the same composition as the particles and substrates used in the adhesion studies, so that the interfacial energies of the materials involved in the adhesion studies will be quantified. This data will provide the basis for a systematic evaluation of hydrophobic interactions between particles and surfaces. Once the form and magnitude of the effect of hydrophobic forces on the particle interactions has been established, it will be possible to develop appropriate theory to describe these effects. The intellectual merit in this proposed work lies in the measurement of the adhesion of deformable, rough, nonuniform particles to deformable, rough surfaces in aqueous solution using an atomic force microscope, and the use of recently developed, experimentally-validated models to describe vdW and ES forces in the adhesion of these particles. This will allow hydrophobic forces to be isolated for these systems. In this fashion, realistic particle-surface interaction forces can be measured with minimal confounding effects from the measurement technique, and the hydrophobic force isolated. The resulting data set will provide a comprehensive view of hydrophobic effects on particle adhesion that will serve as the basis for model development. The broader impacts of the proposed work lie in the importance of enhanced understanding of vdW, ES, and hydrophobic forces in a spectrum of high technology applications. Understanding and controlling the relative strengths of these forces will have a profound impact on the cleaning and sterilization of medical implants, the cleaning of wafers during semiconductor processing, the design of low-fouling coatings for high performance applications, and the development of new approaches for producing highly engineered surfaces with minimal contaminant levels during the fabrication of microelectromechanical systems (MEMS). The results will be disseminated at meetings of the Adhesion Society, the NSF/SRC Center for Environmentally-Benign Semiconductor Manufacture, the American Institute of Chemical Engineers, and the Electrochemical Society. The results will be published in the Journal of Adhesion.

摘要CTS-04014019S。疏水作用力在水环境中颗粒与表面黏附中的作用还没有被充分了解。需要收集能够量化疏水效应的数据，也需要发展描述这种效应的理论。在这项拟议的工作中，原子力显微镜将被用来直接测量水溶液中颗粒和感兴趣的基质之间的粘附性。在测量附着力之前和之后，将测量衬底的粗糙度以及颗粒的粗糙度和几何形状。还将确定颗粒和基材的弹性性质。有了这些信息，在亚利桑那州立大学Beaudoin实验室开发的粒子粘合模型将用于量化作用在这些系统中的范德华(VDW)和静电(ES)相互作用力。这些模型考虑了变形和非均匀几何形态对附着力的影响。在评估了VDW和ES的作用力之后，这些系统中的剩余作用力将主要归因于疏水现象。以这种方式，将对一些不同尺寸和几何形状的粒子与一些表面相互作用的疏水相互作用力进行系统的实验研究。接触角测量将在与附着力研究中使用的颗粒和衬底相同的组成的材料平板上进行，以便量化附着力研究中涉及的材料的界面能。这些数据将为系统评估颗粒和表面之间的疏水相互作用提供基础。一旦确定了疏水作用力对粒子相互作用的影响的形式和大小，就有可能发展出适当的理论来描述这些影响。这项拟议工作的智慧价值在于使用原子力显微镜测量水溶液中可变形的、粗糙的、不均匀的颗粒与可变形的粗糙表面的附着力，并使用最近开发的、经实验验证的模型来描述这些颗粒附着力中的VDW和ES力。这将允许为这些系统隔离疏水作用力。以这种方式，可以测量真实的粒子-表面相互作用力，测量技术的混杂影响最小，并且疏水性作用力被隔离。由此产生的数据集将提供对颗粒粘附性的疏水影响的全面视图，这将作为模型开发的基础。拟议工作的更广泛影响在于加强对VDW、ES和一系列高科技应用中的疏水力量的理解的重要性。了解和控制这些力量的相对强度将对医疗植入物的清洁和杀菌、半导体加工过程中晶片的清洁、用于高性能应用的低污染涂层的设计以及在微电子机械系统(MEMS)制造过程中生产污染水平最低的高度工程化表面的新方法的开发产生深远影响。结果将在粘合协会、NSF/SRC环境友好半导体制造中心、美国化学工程师学会和电化学学会的会议上公布。研究结果将发表在《粘合》杂志上。