IMR: Development of an Optimized Scanning X-Ray Microdiffraction System for Materials Research and Education

IMR：开发用于材料研究和教育的优化扫描 X 射线微衍射系统

• 批准号: 0416243
• 负责人: Ersan Ustundag
• 金额: $ 32.12万
• 依托单位: Iowa State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2004
• 资助国家: 美国
• 起止时间: 2004-08-01 至 2007-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0416243&HistoricalAwards=false
• 关键词: IMR; Development; Optimized; Scanning; Ray

This project will further develop a very productive synchrotron-based X-ray microdiffraction (mXRD) system at the Advanced Light Source (ALS), Lawrence Berkeley National Laboratory. X-ray microdiffraction is a recent technique that employs sub-um X-ray beams and yields unique information on material structure, strain, texture and defects at the microstructural level. Since most material properties are dictated by mechanisms that occur at this level, mXRD offers a powerful tool to better understand materials. This project will further improve and optimize the mXRD system at ALS by: (i) improving spatial resolution (below 100 nm); (ii) allowing real-time data analysis; (iii) introducing higher strain resolution (down to 10-5) and deeper penetration by extending the X-ray energy range; and (iv) permitting three-dimensional measurements. The new mXRD system will allow the first time study of important problems in materials science and engineering that include stress, structure and domain micromechanics studies in ferroelectrics; investigation of metal deformation at the nanoscale and deformation mechanisms in metallic glasses; study of phase and stress evolution in oxide films; constitutive behavior investigation of shape memory alloys; electromigration and stress studies in microelectronic devices. The upgrade is also expected to raise the productivity of the mXRD beamline significantly due to faster data acquisition and analysis. For education and outreach, this project will offer unique training opportunities to students at all levels between high school and graduate school. This project will add new capabilities to a very productive synchrotron-based X-ray microdiffraction (mXRD) system to allow a new range of challenging materials science problems to be addressed. X-ray microdiffraction has been enabled at the sub-um scale in the last 5 years and the Advanced Light Source (ALS) at Lawrence Berkeley National Laboratory has made pioneering advances in this area. The mXRD technique at ALS has been successfully applied to determine strain and defect distributions at the microstructural level in numerous materials. This project will further improve and optimize the mXRD system at ALS by: (i) improving spatial resolution (below 100 nm); (ii) allowing real-time data analysis; (iii) introducing higher strain resolution (down to 10-5) and deeper penetration by extending the X-ray energy range; and (iv) permitting 3-D measurements. The new mXRD system will allow the first time study of important problems in materials science and engineering that include stress, structure and domain micromechanics studies in ferroelectrics; investigation of metal deformation at the nanoscale and deformation mechanisms in metallic glasses; study of phase and stress evolution in oxide films; constitutive behavior investigation of shape memory alloys; electromigration and stress studies in microelectronic devices. The upgrade is also expected to raise the productivity of the mXRD beamline significantly due to faster data acquisition and analysis. For education and outreach, this project will offer unique training opportunities to students at all levels between high school and graduate school.

该项目将在劳伦斯伯克利国家实验室的高级光源(ALS)中进一步开发一种非常高效的基于同步加速器的X射线显微衍射(MXRD)系统。X射线微衍射是一种利用亚微米X射线束并在微观结构水平上产生关于材料结构、应变、织构和缺陷的独特信息的最新技术。由于大多数材料的性能是由发生在这一水平上的机制决定的，mXRD为更好地理解材料提供了一个强大的工具。该项目将通过：(I)提高空间分辨率(低于100 nm)；(Ii)允许实时数据分析；(Iii)通过扩大X射线能量范围引入更高的应变分辨率(低至10-5)和更深的穿透；以及(Iv)允许进行三维测量，从而进一步改进和优化ALS的mXRD系统。新的mXRD系统将使材料科学和工程中的重要问题首次得到研究，包括铁电材料中的应力、结构和磁区微观力学研究；纳米尺度下的金属变形和金属玻璃中的变形机制研究；氧化物薄膜中的相和应力演化研究；形状记忆合金的本构行为研究；微电子设备中的电迁移和应力研究。由于数据采集和分析的速度更快，预计此次升级还将显著提高mXRD光束线的生产率。在教育和外展方面，该项目将为从高中到研究生院的所有级别的学生提供独特的培训机会。该项目将为一个非常高效的基于同步加速器的X射线微衍射系统增加新的能力，以便解决一系列新的具有挑战性的材料科学问题。在过去的5年里，X射线显微衍射已经在亚微米尺度上得以实现，劳伦斯伯克利国家实验室的先进光源(ALS)在这一领域取得了开创性的进展。在ALS的mXRD技术已经成功地应用于在许多材料的微结构水平上确定应变和缺陷分布。该项目将通过：(I)提高空间分辨率(低于100 nm)；(Ii)允许实时数据分析；(Iii)通过扩大X射线能量范围引入更高的应变分辨率(降至10-5)和更深的穿透；以及(Iv)允许进行3D测量，从而进一步改进和优化ALS的mXRD系统。新的mXRD系统将使材料科学和工程中的重要问题首次得到研究，包括铁电材料中的应力、结构和磁区微观力学研究；纳米尺度下的金属变形和金属玻璃中的变形机制研究；氧化物薄膜中的相和应力演化研究；形状记忆合金的本构行为研究；微电子设备中的电迁移和应力研究。由于数据采集和分析的速度更快，预计此次升级还将显著提高mXRD光束线的生产率。在教育和外展方面，该项目将为从高中到研究生院的所有级别的学生提供独特的培训机会。