MRI: Acquisition of Equipment to Upgrade an Existing Atomic Force Microscope for Quantitative Force Measurements

汤森大学寻求获得必要的硬件和软件，以升级现有纳米显微镜III多模原子力显微镜(AFM)的力测量能力。改进包括一种新的创新扫描仪，具有z轴的闭环控制，在20微米的运动范围内提供尖端-样品分离的精确控制。此外，还将包括一个具有低相干长度光源的低噪声AFM头，它消除了周期性噪声(干扰效应)，并实现了真正的热限制皮牛顿尺度性能。这次升级将提供必要的定量测力能力，以执行包括几个多学科项目的实验。具体地说，该仪器将用于研究纳米结构材料中的光致磁性、电荷对粘附力的影响、材料之间的电荷转移过程以及真菌的机械性能和相互作用。除了在我们的研究项目中使用外，更新后的仪器将为本科生和研究生教育提供更多机会。这一工具将在实验室教学中(作为本科课程的一部分)以及在所有上述研究领域的本科生和研究生研究项目中使用。此外，这种设备将为参加汤森大学NSF REU/RET计划的本科生和高中教师提供更多的机会。原子力显微镜(AFM)已成功地用于工业、政府和学术研究20多年。这些显微镜使纳米技术领域焕发出新的活力，为科学家提供了“看到”和操纵纳米大小物体的能力。虽然它最著名的能力是提供极其详细的表面特征的三维图像，但它也能够定量测量物体之间的力。在过去的10年里，随着新技术的出现，商业上可用的原子力显微镜在复杂性和能力方面都有所增加。这项提议寻求升级现有的纳米显微镜III原子力显微镜，以纳入新的技术能力。这一改进将提供研究新的数据存储方法的能力，并获得关于电荷如何影响微米级颗粒粘附性的基础知识。它还将允许研究真菌的机械和粘附性，从而更有效地生产真菌副产品，并开发更好的作物抑制剂。这一仪器不仅将影响科学界，还将用于教育未来的科学家。

Towson University seeks to acquire hardware and software necessary to upgrade the force measurement capabilities of an existing Nanoscope III Multimode Atomic Force Microscope (AFM). Improvements include a new, innovative scanner with a closed-loop control of the z-axis, providing precise control of tip-sample separation over a 20 microns range of motion. Additionally a low noise AFM head with low coherence length light source will be included which eliminates periodic noise (interference effects) and achieves true thermally limited pico-Newton scale performance. The upgrade will provide the quantitative force measurement capabilities necessary to perform experiments encompassing several multidisciplinary projects. Specifically, the instrument will be used to study the light induced magnetism in nanostructured materials, the influence of charge on adhesion, the process of charge transfer between materials, and the mechanical properties and interactions of fungi. In addition to the use in our research programs, an updated instrument will provide added opportunities in undergraduate and graduate education. The educational use of this instrument will occur in laboratory instruction (as a part of undergraduate curriculum) as well as through its use in undergraduate and graduate research projects in all the above-mentioned research areas. Additionally, this equipment will expand the opportunities for undergraduate students and high school teachers participating in Towson University's NSF REU/RET program.The Atomic Force Microscope (AFM) has been successfully used in industrial, government and academic research for over two decades. These microscopes have rejuvenated the area of nanotechnology, providing scientists with the ability to "see" and manipulate nanometer - size objects. While best known for its ability to provide extremely detailed, three dimensional images of surface features, it is also capable of quantitatively measuring forces between objects. Within the last 10 years, commercially available AFMs have increased in sophistication and capabilities as new technologies have become available. This proposal seeks to upgrade an existing Nanoscope III Atomic Force Microscope to incorporate new technological capabilities. This improvement will provide the ability to study novel methods for data storage and gain fundamental knowledge of how charge affects adhesion in micron-size particles. It will also allow the study of mechanical and adhesive properties of fungi leading to more efficient production of fungal byproducts and the development of better inhibitors for crops. This instrument will not only impact the scientific community, but will also be used to educate future scientists.