Nanotechnology Research at Towson University

摘要CTS-9977530 D。将购买在陶森州立大学开发纳米技术设施所需的设备。 该设施的目标包括（1）提供必要的设备，空间和专业知识，以协助研究人员在陶森大学进行前沿研究，（2）提供必要的设施，以促进与其他大学和工业研究人员的合作，以及（3）提供一个设施，教育学生（本科生和研究生），教师在使用纳米技术。 几个关键组件已经组装这样的实验室，包括空间，人员，和一个扫描探针显微镜专门为本科生和研究生班在陶森。 目前还没有一个研究质量的扫描探针显微镜是必要的实现前两个目标。仪器的主要部分需要为纳米技术实验室是一个数字仪器多模TM原子力显微镜（AFM）。 在原子力显微镜中，柔性悬臂梁用于探测材料表面。 通过监测悬臂在表面上移动时的偏转，原子力显微镜能够以亚纳米分辨率在真实的空间和真实的时间中以三维方式对导电和绝缘材料的表面形貌进行成像。 此外，它具有在各种环境中工作的能力，包括空气、真空和液体介质。 原子力显微镜还展示了定量测量两种材料之间的相互作用力的能力

AbstractCTS-9977530D. Schaefer, Towson State UniversityThe necessary equipment to develop a Nanotechnology facility at Towson State University will be purchased. The goals of this facility include (1) to provide the necessary equipment, space and expertise to assist researchers at Towson University in performing cutting edge research, (2) to provide the facilities necessary to promote collaborations with other university and industrial researchers, and (3) to provide a facility which educates students (both undergraduate and graduate), and faculty in the use of nanotechnology. Several key components have been assembled for such a laboratory, including space, personnel, and a scanning probe microscope dedicated for undergraduate and graduate classes at Towson. There does not exist a research quality scanning probe microscope that is necessary for the achievement of the first two goals.The major piece of instrumentation needed for the Nanotechnology Laboratory is a Digital Instruments Multimode TM Atomic Force Microscope (AFM). In the AFM, a flexible cantilever is used to probe the surface of materials. By monitoring the deflection of the cantilever as it is moves across the surface, the Atomic Force Microscope is capable of imaging the surface topography of conducting and insulating materials in three dimensions, in real space, and in real time with sub-nanometer resolution. Additionally, it has the capability of operating in a variety of environments, including air, vacuum, and under liquid media. The AFM has also demonstrated the ability to quantitatively measure the interaction force between two materials