MRI: Acquisition of X-ray Photoelectron Spectroscopy System for Thin Films Research and Education

MRI：购置 X 射线光电子能谱系统用于薄膜研究和教育

• 批准号: 0521624
• 负责人: Zbigniew Celinski
• 金额: $ 19.7万
• 依托单位: University of Colorado at Colorado Springs
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2005
• 资助国家: 美国
• 起止时间: 2005-09-01 至 2006-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0521624&HistoricalAwards=false
• 关键词: MRI; Acquisition; ray; Photoelectron; Spectroscopy

We seek to acquire an X-ray Photoelectron (XPS) / Auger Electron spectroscopy (AES) system for enhanced chemical characterization of surfaces and thin films. Specifically, we propose purchase of a PHOIBOS 100 hemispherical analyzer for charged particles (designed to work for XPS, AES, UPS, SAM, and ISS) and electron, X-ray, and UV sources from SPECS. The PHOIBOS 100 analyzer will allow us to study areas as small as 200 mm and carry out angle resolved and spatial resolved XPS and AES measurements. Since it has the possibility of working in multi channeltron mode (up to 9) this unit has very good energy resolution, 200 kcps @ 0.85 eV FWHM for Ag3d5/2 and 300 W Mg Ka in XPS mode and ultra high resolution of 4.4 meV on Ar 3p1/2 in UPS mode (He excitation). The PHOIBOS 100 analyzer, in combination with Scanning Electron gun (model EQ22/35), X-Ray Source (model XR-50), Ultraviolet Source (model UVS 10/35), and differentially pumped small-spot ion-gun (model IQE 12/38) will significantly expand our existing Molecular Beam Epitaxy system capability and will help us resolve important issues in understanding the correlations between chemical, structural and dynamic magnetic properties in multi-layered structures. In particular, we will investigate a series of problems which require very careful characterization of the chemical state of (mostly magnetic) elements at interfaces. For example, recently we have found that the rotational anisotropy in exchange bias systems (Fe/MnF2 and Fe/KNiF3) exhibit significantly different strength along the easy and hard axes of Fe ultrathin films. To understand the nature of this new effect we need to investigate the interaction between Fe atoms at the interface and antiferromagnets (MnF2 or KNiF3). The XPS technique is indispensable for such studies. Another interesting problem we would like to study is mixed valency of Eu atoms at the surface of the ultrathin EuF3 films and different Eu intermetallic compounds. This new instrumentation will significantly expand our research and teaching capabilities allowing us, together with students, to attack intriguing and important scientific problems.The purchase of electron spectroscopy components for surface and thin film physics will significantly strengthen our teaching, basic research, and interaction between our department and local industry. The educational impact of this equipment on students is integrated in student participation in research as well as in specific courses such as advanced laboratory classes. Our laboratory offers a special opportunity for both undergraduate and graduate (M.S.) student training. By gaining laboratory expertise in both synthesis and measurements of thin films, students trained in our research group are well positioned to pursue careers in academia and in the Colorado semiconductor and magnetic storage industries. The proposed equipment will complement our existing facilities by allowing us to perform chemical characterization of materials along with the existing structural, magnetic and electrical characterization capabilities. Furthermore, we will be able to explore exciting issues of basic research such as understanding the correlations between chemical, structural and dynamic magnetic properties in multi-layered structures. In particular, we will investigate a series of problems which require very careful characterization of the chemical state of (mostly magnetic) elements at interfaces. Finally, this new equipment will allow us to collaborate more with small local R&D companies and help them to solve problems related to surface physics.

我们寻求获得x射线光电子(XPS) /俄歇电子能谱（AES）系统，以增强表面和薄膜的化学表征。具体来说，我们建议从SPECS购买PHOIBOS 100半球形带电粒子分析仪（设计用于XPS， AES， UPS， SAM和ISS）和电子，x射线和紫外线源。PHOIBOS 100分析仪将允许我们研究小到200毫米的区域，并进行角度分辨和空间分辨的XPS和AES测量。由于它有可能在多通道电子模式下工作（最多9个），因此该单元具有非常好的能量分辨率，Ag3d5/2的200 kcps @ 0.85 eV FWHM和XPS模式下的300 W Mg Ka，以及UPS模式（He激励）下Ar 3p1/2的4.4 meV超高分辨率。PHOIBOS 100分析仪与扫描电子枪（型号EQ22/35）、x射线源（型号XR-50）、紫外源（型号UVS 10/35）和差分泵浦小点离子枪（型号IQE 12/38）相结合，将大大扩展我们现有的分子束外延系统的能力，并将帮助我们解决理解多层结构中化学、结构和动态磁性之间相关性的重要问题。特别是，我们将研究一系列问题，这些问题需要非常仔细地表征界面上（主要是磁性）元素的化学状态。例如，最近我们发现交换偏倚体系（Fe/MnF2和Fe/KNiF3）的旋转各向异性在Fe超薄膜的易轴和硬轴上表现出明显不同的强度。为了理解这种新效应的本质，我们需要研究界面上的铁原子与反铁磁体（MnF2或KNiF3）之间的相互作用。XPS技术在此类研究中是不可或缺的。我们想研究的另一个有趣的问题是超薄EuF3薄膜和不同Eu金属间化合物表面Eu原子的混合价。这种新仪器将大大扩展我们的研究和教学能力，使我们能够与学生一起研究有趣和重要的科学问题。购买用于表面和薄膜物理的电子能谱元件将大大加强我们的教学，基础研究以及我们部门与当地工业的互动。这种设备对学生的教育影响是整合在学生参与研究以及特定课程，如高级实验课。我们的实验室为本科生和研究生提供了一个特殊的培训机会。通过在薄膜合成和测量方面获得实验室专业知识，在我们研究小组接受培训的学生将很好地定位在学术界和科罗拉多州半导体和磁存储行业的职业生涯中。拟议的设备将补充我们现有的设施，使我们能够对材料进行化学表征以及现有的结构，磁性和电学表征能力。此外，我们将能够探索令人兴奋的基础研究问题，如了解多层结构中化学，结构和动态磁性之间的相关性。特别是，我们将研究一系列问题，这些问题需要非常仔细地表征界面上（主要是磁性）元素的化学状态。最后，这种新设备将使我们能够更多地与当地的小型研发公司合作，帮助他们解决与表面物理有关的问题。