Correlation between structural and optical properties of single semiconductor nanowires with core-shell heterostructure
Correlation between structural and optical properties of single semiconductor nanowires with core-shell heterostructure
批准号:
175391613
负责人:
Dr. Lutz Geelhaar
金额:
$0.0万
依托单位国家:
德国
项目类别:
Research Grants
财政年份:
2010
资助国家:
德国
项目状态:
已结题
起止时间:
2009-12-31 至 2018-12-31
中文摘要
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英文摘要
Semiconductor nanowires have emerged as an important materials basis both for studying fundamental physics and for fabricating novel devices. In the nanowire geometry, strain can elastically relax at the free sidewalls, and thus heterostructures of dissimilar materials can be grown in a crystalline quality that is impossible to obtain in planar thin films. At the same time, the quasi one-dimensional shape, nanometric size, and high surface-to-volume ratio of nanowires can lead to unexpected effects. In order to understand, predict, and control the physical properties of nanowires, it is imperative to elucidate how the properties of interest depend on the nanowire structure. The overall objective of this project is to correlate the optical and structural properties of single GaAs nanowires with radial (In,Ga)As/GaAs quantum well. For such nanowire heterostructures a larger critical thickness for the formation of dislocations is expected than in their planar counterparts, because the strain induced by lattice mismatch is shared between (In,Ga)As quantum well and GaAs core and outer shell. Also, the optical transitions are anticipated to be different for the nanowire heterostructure, because the strain state of the quantum well is modified, the band structure is affected by lateral band bending due to Fermi level pinning at the nanowire sidewalls, and the nature of the entire structure is intrinsically three-dimensional.The ambitious experimental goal is to measure subsequently for one and the same single nanowire the optical and structural properties, and carry out such measurements for series of samples with systematic variations in structure. Samples will be grown by molecular beam epitaxy, the optical properties will be investigated by photo- and cathodoluminescence spectroscopy, and the structure will be analyzed by x-ray nanodiffraction. In order to obtain a deep understanding of the structure-property correlation, experiments will be complemented by continuum elasticity and multiband-k.p calculations of the optical transitions. We will identify the observed emission lines, assign them to structural features, and elucidate how these lines vary with In content and/or quantum well thickness.
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DOI:
10.1103/physrevmaterials.2.014604
发表时间:
2018-01-19
期刊:
PHYSICAL REVIEW MATERIALS
影响因子:
3.4
作者:
[Al Hassan, Ali, Lewis, R. B., Pietsch, U.]
通讯作者:
Pietsch, U.
Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging
相干 X 射线衍射成像揭示六边形核壳 (In,Ga)As/GaAs 纳米线的三重旋转对称性
DOI:
10.1107/s1600576717004149
发表时间:
2017
期刊:
Journal of Applied Crystallography
影响因子:
6.1
作者:
[A. Davtyan, T. Krause, D. Kriegner, A. Al-Hassan, D. Bahrami, S.M. Mostafavi Kashani, R.B. Lewis, H. Küpers, A. Tahraoui, L. Geelhaar, M. Hanke, S.J. Leake, O. Loffeld, U. Pietsch]
通讯作者:
U. Pietsch
DOI:
10.1021/acs.nanolett.6b03681
发表时间:
2017-01
期刊:
Nano letters
影响因子:
10.8
作者:
[R. Lewis;Lars Nicolai;H. Küpers;M. Ramsteiner;A. Trampert;L. Geelhaar]
通讯作者:
R. Lewis;Lars Nicolai;H. Küpers;M. Ramsteiner;A. Trampert;L. Geelhaar
DOI:
10.1088/1361-6641/aa8c15
发表时间:
2017-11-01
期刊:
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
影响因子:
1.9
作者:
[Kuepers, Hanno, Tahraoui, Abbes, Geelhaar, Lutz]
通讯作者:
Geelhaar, Lutz
Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction
通过纳米束 X 射线衍射表征纤锌矿 GaAs 纳米线中的单个堆垛层错
DOI:
10.1107/s1600577517009584
发表时间:
2017
期刊:
Journal of Synchrotron Radiation
影响因子:
2.5
作者:
[A. Davtyan, S. Lehmann, D. Kriegner, R.R. Zamani, K.A. Dick, D. Bahrami, A. Al- Hassan, S.J. Leake, U. Pietsch, V. Holý]
通讯作者:
V. Holý
共 8 条
Photoelectrochemical CO2 conversion with tunable semiconductor nanostructures
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批准号:442704684
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项目类别:Research Grants
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资助金额:$0.0万
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财政年份:--
-
负责人:Dr. Lutz Geelhaar
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依托单位:
Charge carrier dynamics under the influence of extreme strain gradients realized in bent semiconductor nanowires
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批准号:434114264
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项目类别:Research Grants
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资助金额:$0.0万
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财政年份:--
-
负责人:Dr. Lutz Geelhaar
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依托单位:
海外基金