Elimination of low-K interfacial transition regions on crystalline Ge, and on ultra thin Ge passivation layers on GaAs and InGaAs: a pathway to EOT scaling to 0.5 nm
Elimination of low-K interfacial transition regions on crystalline Ge, and on ultra thin Ge passivation layers on GaAs and InGaAs: a pathway to EOT scaling to 0.5 nm
批准号:
0823805
负责人:
Gerald Lucovsky
金额:
$33.0万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2008
资助国家:
美国
项目状态:
已结题
起止时间:
2008-09-01 至 2012-08-31
中文摘要
点击翻译按钮获取中文摘要
英文摘要
From: Gerry Lucovsky10 June 2008Ref: Proposal 00823805Short Abstract i) Objective and Approach: The objectives of this research are to provide a science base for optimization of scaled Ge CMOS devices by reducing defects at Ge dielectric interfaces, and to minimize low-K interfacial transition regions that limit equivalent oxide thickness scaling. The approach includes optimization of wet chemical pre-deposition cleaning, nitride passivation of Ge surfaces to prevent subcutaneous oxidation during high-K dielectric depositions, advanced spectroscopic techniques to monitor evolution of N from buried interfaces during post deposition anneals, and spectroscopic and electrical studies comparing interfacial and bulk defects. ii) Intellectual Merit: The proposed research will extend nano-CMOS devices to the 11 nm 2022 processing node by developing device-quality Ge-dielectric interfaces without native Ge oxide, nitride and oxynitride interfacial transition regions. Integration of nano-scale Hf Ge oxynitride interfacial layers will reduce attainable EOT scaling by eliminating lower-K SiON interfacial layers on Si substrates. In-house cathodoluminescence and spectroscopic ellipsometry plus synchrotron XAS and XPS will distinguish between pre-existing, and processing and stress induced defects. Exploratory studies will evaluate a similar approach for compound semiconductor substrates.iii) Broader Impact: This project will expand the Research Experience for High School Women program to include women from Columbus area high schools, including summer research opportunities on the OSU campus. With support from the College of Engineering, the Women in Engineering Program, and the Department of Electrical & Computer Engineering, an expanded program will include local high school junior-level science teachers, selecting highly motivated and talented women and pairing them with OSU engineering faculty. Similar programs will be implemented at NCSU.
期刊论文(0)
专著(0)
科研奖励(0)
会议论文
An International Topics Conference on the Physics of Mos Insulators; June 18-20, 1980, Raleigh, North Carolina
-
批准号:8003288
-
项目类别:Standard Grant
-
资助金额:$0.5万
-
财政年份:1980
-
负责人:Gerald Lucovsky
-
依托单位:
国内基金
海外基金
登录
查看更多内容
骨髓微环境中正常造血干/祖细胞新亚群IL7Rα(-)LSK(low)细胞延缓急性髓系白血病进程的作用及机制研究
-
批准号:
-
项目类别:省市级项目
-
资助金额:--
-
批准年份:2025
-
负责人:王震毅
-
依托单位:
MSCEN聚集体抑制CD127low单核细胞铜死亡治疗SLE 的机制研究
-
批准号:
-
项目类别:省市级项目
-
资助金额:--
-
批准年份:2024
-
负责人:耿林玉
-
依托单位:
脐带间充质干细胞微囊联合低能量冲击波治疗神经损伤性ED的机制研究
-
批准号:82371631
-
项目类别:面上项目
-
资助金额:49.00万元
-
批准年份:2023
-
负责人:卢慕峻
-
依托单位:
Ni-20Cr合金梯度纳米结构的低温构筑及其腐蚀行为研究
-
批准号:52301123
-
项目类别:青年科学基金项目
-
资助金额:30.00万元
-
批准年份:2023
-
负责人:郭晓开
-
依托单位:
LIPUS促进微环境巨噬细胞释放CCL2诱导尿道周围平滑肌祖细胞定植与分化的机制研究
-
批准号:82370780
-
项目类别:面上项目
-
资助金额:49.00万元
-
批准年份:2023
-
负责人:夏术阶
-
依托单位:
新型PDL1+CXCR2low中性粒细胞在脉络膜新生血管中的作用及机制研究
-
批准号:82271095
-
项目类别:面上项目
-
资助金额:56万元
-
批准年份:2022
-
负责人:柳夏林
-
依托单位:
CD9+CD55low脂肪前体细胞介导高脂诱导脂肪组织炎症和2型糖尿病的作用和机制研究
-
批准号:82270883
-
项目类别:面上项目
-
资助金额:52万元
-
批准年份:2022
-
负责人:毕艳
-
依托单位:
CD21low/-CD23-B细胞亚群在间质干细胞治疗慢性移植物抗宿主病中的作用机制研究
-
批准号:--
-
项目类别:面上项目
-
资助金额:52万元
-
批准年份:2022
-
负责人:陈小湧
-
依托单位:
探究Msi1+Lgr5neg/low肠道干细胞抵抗辐射并驱动肠上皮再生的新机制
-
批准号:82270588
-
项目类别:面上项目
-
资助金额:52万元
-
批准年份:2022
-
负责人:吕聪
-
依托单位:
m6A去甲基化酶FTO通过稳定BRD9介导表观重塑在HIF2α(low/-)肾透明细胞癌中的作用机制研究
-
批准号:--
-
项目类别:面上项目
-
资助金额:54.7万元
-
批准年份:2021
-
负责人:徐丹枫
-
依托单位: