International Conference on Nanoscience and Technology (ICN+T); Keystone, Colorado; July 20-25, 2008

该奖项的目的是支持学生和博士后研究人员参加国际纳米科学与技术会议（ICN+T 2008）的旅费和注册费，该会议将于2008年7月20日至25日在科罗拉多州的Keystone举行。这一重要的国际会议为讨论扫描探针和相关技术的最新进展以及纳米科学技术的最新发展提供了一个独特的论坛。ICN+T将两个前长期（自20世纪80年代以来）和非常成功的国际会议-扫描隧道显微镜/光谱学和相关技术（STM）国际会议和纳米会议-合并为一个会议。第一次联合会议于2006年在瑞士巴塞尔举行，有1500多名国际与会者。ICN+T 2008将在美国举行，让美国的科学家和学生有机会与来自世界各地的顶尖纳米科学家进行互动。所要求的支持对于确保高水平的学生参与至关重要。正如2007年修订的NNI战略计划所指出的那样，纳米尺度将在若干应用领域提供重要的创新——医药/健康、环境修复和传感、安全/负担得起的水、信息设备的持续改进以及能源效率/安全性的提高。改进的测量/操作工具的可用性将加速从实验室发现向这些技术的过渡。此外，这些工具将为工业生产高质量技术设备所需的标准/计量提供基础。本次会议在仪器开发人员和使用这些仪器进行最先进研究的人员之间进行了有效的结合。会议将为美国研究界，特别是其年轻成员提供与来自世界各地的仪器仪表研究人员建立个人关系的机会。此外，会议记录将发表在真空科学与技术杂志上。

The objective of this award is to support the travel and registration expenses of student and postdoctoral researchers to the International Conference on Nanoscience and Technology (ICN+T 2008) to be held in Keystone, Colorado from July 20-25, 2008. This major international meeting provides a singular forum for discussion of the recent advances in scanning probe and related techniques and the latest developments in nanoscale science and technology. The ICN+T combines two former longstanding (since the 1980s), and highly successful international meetings - the International conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM) and Nano - into a single meeting. The first combined meeting was held in Basel, Switzerland in 2006 with over 1500 international participants. ICN+T 2008 will be held in the USA, giving USA scientists and students a chance to interact with leading nanoscientists from all over the world. The requested support is critical to assuring a high level of student participation. As pointed out in the 2007 revised NNI Strategic Plan, there are several applications where the nanoscale will provide important innovations medicine/health, environmental remediation and sensing, safe/affordable water, continued improvements in information devices, and increased energy efficiency/security. The transition from laboratory discovery to those technologies will be accelerated by the availability of improved measurement/manipulation tools. Further those tools will provide the basis for the standards/metrology needed by industry to manufacture quality technological devices. This conference has an effective marriage between instrument developers and those who use those instruments for state-of-art investigations. The conference will provide the US research community especially its younger members with the opportunity to establish personal relationships with the researchers in instrumentation from around the world. In addition, the proceedings will be published in the Journal of Vacuum Science and Technology.