High resolution and analytical electron microscopy. (A07)

高分辨率和分析电子显微镜。

• 批准号: 211495830
• 金额: --
• 依托单位: Lehrstuhl für Mikro- und Nanostrukturforschung
• 依托单位国家: 德国
• 项目类别: CRC/Transregios
• 财政年份: 2012
• 资助国家: 德国
• 起止时间: 2011-12-31 至 2022-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/211495830?language=en
• 关键词: resolution; analytical; electron; microscopy.; A07

Project A7 utilizes high resolution and analytical TEM techniques to study the atomic structure and local chemistry of crystal defects, interfaces, foreign phases and surface layers. Elemental segregation to dislocations and planar faults are investigated to understand its role in high temperature creep. So-called nano diffusion couples are studied in order to obtain relevant diffusion data for the chemically complex phases of superalloys. Finally, electron and X-ray tomography techniques are applied to characterize the 3D-structure of TCP-phases, oxide scales and other complex microstructures.

A7项目利用高分辨率和分析TEM技术来研究晶体缺陷、界面、外来相和表面层的原子结构和局部化学。研究元素偏析与位错和平面断层在高温蠕变中的作用。为了获得高温合金化学复杂相的相关扩散数据，研究了所谓的纳米扩散偶。最后，应用电子和x射线断层扫描技术表征tcp相、氧化层和其他复杂微结构的3d结构。