High resolution and analytical electron microscopy. (A07)

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Project A7 utilizes high resolution and analytical TEM techniques to study the atomic structure and local chemistry of crystal defects, interfaces, foreign phases and surface layers. Elemental segregation to dislocations and planar faults are investigated to understand its role in high temperature creep. So-called nano diffusion couples are studied in order to obtain relevant diffusion data for the chemically complex phases of superalloys. Finally, electron and X-ray tomography techniques are applied to characterize the 3D-structure of TCP-phases, oxide scales and other complex microstructures.