MRI: Acquisition of Raman-AFM-Lifetime System for Materials Research and Training

PI：Sokolov，Igor Proposal：1428919标题：MRI：获取用于材料研究和培训的拉曼-AFM-Lifetime系统意义所需的系统能够从样品表面的同一区域收集多个参数(使用拉曼、AFM和光学激发)，从而为更好地了解表面特性打开了可能性。与以前的系统相比，该系统具有显著的优势，包括功能结构研究和使用较少的激光辐射量，从而允许以非破坏性的方式研究许多有机样品，并更快地获取拉曼图谱。这种新版本的共焦成像拉曼光谱仪能够以比以前更快的速度收集样品表面的拉曼光谱。它为研究和教育打开了一扇机会之窗。除了可以非破坏性地研究有机样品外，它还将实现更快的拉曼图谱获取，从而允许使用该仪器为学生进行实时演示。技术说明WITec仪器公司最先进的集成拉曼-AFM-寿命系统(Alpha 300R+拉曼系统)由三个集成部分组成：共焦拉曼成像光谱仪、原子力显微镜(AFM)和时间相关单光子计数器。它允许测量材料参数的独特协同组合，这使该仪器成为大量潜在应用和用户的独特平台。该仪器在塔夫茨大学工程学院托管，将由塔夫茨大学多个系和学校的研究人员以及外部研究人员使用，包括来自大波士顿地区的研究人员(那里没有类似的仪器)。该仪器提供材料和应力特定信息(拉曼部分)、物理参数(表面形貌、电荷、样品的粘弹性模数；原子力显微镜部分)和光激发寿命(寿命部分)。所有这些参数都是在样品表面的同一位置测量的。此外，AFM部分将通过尖端增强拉曼光谱(TERS)与AFM相结合，大大提高拉曼映射的空间分辨率。例如，单光子灵敏度的选择和测量辐射光寿命的能力不仅允许发光寿命映射，而且允许分离真实的拉曼和(有时是拉曼外观的)荧光信号，这对于定量测量是重要的。

PI: Sokolov, IgorProposal: 1428919Title: MRI: Acquisition of Raman-AFM-Lifetime System for Materials Research and TrainingSignificanceThe requested system has the ability to collect multiple parameters (using Raman, AFM and optical excitation) from the same area of the sample surface, opening the possibility for a better understanding of surface properties. The system has significant advantages over previous systems, including function-structure studies and uses a smaller amount of laser radiation, thus allowing the study of many organic samples in non-destructive way, and faster acquisition of Raman maps. This new version of confocal imaging Raman spectrometer allows collection of Raman spectra over a sample surface much faster than was previously possible. It opens a window of opportunities for both research and education. In addition to allowing studies of organic samples non-destructively, it will achieve faster acquisition of Raman maps allowing the use of the instrument for real-time demonstrations for students.Technical DescriptionThe state-of-the-art integrated Raman-AFM-Lifetime system by WITec Instruments Corp. (Alpha 300R+ Raman system) consists of three integrated parts: a Confocal Raman imaging spectrometer, an atomic force microscope (AFM), and a time-correlated single photon counter. It allows measuring a unique synergistic combination of material parameters, which makes this instrument a unique platform for a large number of potential applications and users. The instrument, hosted at the School of Engineering of Tufts University, will be used by researchers from multiple department and schools across Tufts University as well as outside researchers, including those from the Greater Boston Area (in which no similar instrument exists). The instrument gives the material and stress specific information (the Raman part), physical parameters (topography, electrical charges, viscoelastic moduli of the sample; the AFM part), and lifetime of optical excitation (the lifetime part). All these parameters are measured at the same location on the sample surface. Furthermore, the AFM part will substantially enhance the spatial resolution of the Raman mapping by using a combination with AFM through the tip-enhanced Raman spectroscopy (TERS). The option of single-photon sensitivity and ability to measure life-time of radiated light allow, for example, not only luminescent life-time mapping but also the separation of true Raman and (sometimes Raman-look) fluorescent signals, which is important for quantitative measurements.