MRI: Acquisition of Raman-AFM-Lifetime System for Materials Research and Training

MRI：获取用于材料研究和培训的拉曼 AFM 寿命系统

• 批准号: 1428919
• 负责人: Igor Sokolov
• 金额: $ 63.46万
• 依托单位: Tufts University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2014
• 资助国家: 美国
• 起止时间: 2014-09-01 至 2017-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1428919&HistoricalAwards=false
• 关键词: MRI; Acquisition; Raman; AFM; Lifetime

PI: Sokolov, IgorProposal: 1428919Title: MRI: Acquisition of Raman-AFM-Lifetime System for Materials Research and TrainingSignificanceThe requested system has the ability to collect multiple parameters (using Raman, AFM and optical excitation) from the same area of the sample surface, opening the possibility for a better understanding of surface properties. The system has significant advantages over previous systems, including function-structure studies and uses a smaller amount of laser radiation, thus allowing the study of many organic samples in non-destructive way, and faster acquisition of Raman maps. This new version of confocal imaging Raman spectrometer allows collection of Raman spectra over a sample surface much faster than was previously possible. It opens a window of opportunities for both research and education. In addition to allowing studies of organic samples non-destructively, it will achieve faster acquisition of Raman maps allowing the use of the instrument for real-time demonstrations for students.Technical DescriptionThe state-of-the-art integrated Raman-AFM-Lifetime system by WITec Instruments Corp. (Alpha 300R+ Raman system) consists of three integrated parts: a Confocal Raman imaging spectrometer, an atomic force microscope (AFM), and a time-correlated single photon counter. It allows measuring a unique synergistic combination of material parameters, which makes this instrument a unique platform for a large number of potential applications and users. The instrument, hosted at the School of Engineering of Tufts University, will be used by researchers from multiple department and schools across Tufts University as well as outside researchers, including those from the Greater Boston Area (in which no similar instrument exists). The instrument gives the material and stress specific information (the Raman part), physical parameters (topography, electrical charges, viscoelastic moduli of the sample; the AFM part), and lifetime of optical excitation (the lifetime part). All these parameters are measured at the same location on the sample surface. Furthermore, the AFM part will substantially enhance the spatial resolution of the Raman mapping by using a combination with AFM through the tip-enhanced Raman spectroscopy (TERS). The option of single-photon sensitivity and ability to measure life-time of radiated light allow, for example, not only luminescent life-time mapping but also the separation of true Raman and (sometimes Raman-look) fluorescent signals, which is important for quantitative measurements.

主要研究者：索科洛夫，伊戈尔建议：1428919标题：核磁共振成像：采购拉曼-原子力显微镜寿命系统用于材料研究和培训意义所要求的系统能够从样品表面的同一区域收集多个参数（使用拉曼、原子力显微镜和光学激发），从而为更好地了解表面特性提供了可能性。该系统具有显着的优势，比以前的系统，包括功能结构的研究，并使用较少量的激光辐射，从而允许在非破坏性的方式研究许多有机样品，并更快地获取拉曼地图。这种新版本的共焦成像拉曼光谱仪允许收集样品表面的拉曼光谱比以前快得多。它为研究和教育打开了一扇机会之窗。除了可以无损地研究有机样品外，它还可以更快地获取拉曼图谱，使学生可以使用该仪器进行实时演示。技术说明WITec Instruments Corp.（Alpha 300 R+拉曼系统）由三个集成部分组成：共焦拉曼成像光谱仪、原子力显微镜（AFM）和时间相关单光子计数器。它允许测量材料参数的独特协同组合，这使得该仪器成为大量潜在应用和用户的独特平台。该仪器由塔夫茨大学工程学院托管，将由塔夫茨大学多个部门和学校的研究人员以及外部研究人员使用，包括来自大波士顿地区的研究人员（其中没有类似的仪器）。该仪器给出材料和应力特定信息（拉曼部分）、物理参数（形貌、电荷、样品的粘弹性模量; AFM部分）和光激发的寿命（寿命部分）。所有这些参数都是在样品表面上的同一位置测量的。此外，AFM部分将通过使用与AFM的组合通过尖端增强拉曼光谱（TERS）来显著增强拉曼映射的空间分辨率。单光子灵敏度的选择和测量辐射光的寿命的能力不仅允许例如发光寿命映射，而且允许分离真实的拉曼和（有时拉曼外观）荧光信号，这对于定量测量是重要的。

项目成果

Absorption of organic compounds by mesoporous silica discoids

• DOI: 10.1016/j.micromeso.2020.110379
• 发表时间: 2020-10
• 期刊: Microporous and Mesoporous Materials
• 影响因子: 5.2
• 作者: S. Palantavida;Berney Peng;I. Sokolov

Ultrabright Fluorescent Silica Nanoparticles for Multiplexed Detection

• DOI: 10.3390/nano10050905
• 发表时间: 2020-05-01
• 期刊: NANOMATERIALS
• 影响因子: 5.3
• 作者: Peerzade, Saquib Ahmed M. A.;Makarova, Nadezda;Sokolov, Igor
• 通讯作者: Sokolov, Igor

Can AFM be used to measure absolute values of Young's modulus of nanocomposite materials down to the nanoscale?

AFM 能否用于测量纳米复合材料杨氏模量的绝对值直至纳米尺度？

• DOI: 10.1039/d0nr02314k
• 发表时间: 2020-06-21
• 期刊: NANOSCALE
• 影响因子: 6.7
• 作者: Liu, Yuke;Sokolov, Igor;Peng, Ping'an
• 通讯作者: Peng, Ping'an