SBIR Phase I: Advanced Computational Imaging System for 3D Surface Microgeometry and Reflectance Properties Measurement

SBIR 第一阶段：用于 3D 表面微观几何和反射特性测量的先进计算成像系统

• 批准号: 1722381
• 负责人: Lingfei Meng
• 金额: $ 22.5万
• 依托单位: MURA INC.
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2017
• 资助国家: 美国
• 起止时间: 2017-07-01 至 2017-12-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1722381&HistoricalAwards=false
• 关键词: SBIR; Phase; Advanced; Computational; Imaging

The broader impact/commercial potential of this Small Business Innovation Research (SBIR) Phase I project can lead to a revolution in 3D microgeometry and reflectance properties measurement of object surfaces at the micron-scale. The proposed technology will significantly improve photorealistic rendering and enhance the workflow efficiency in physically-based rendering. This can impact a broad range of industries, including video games, product visualization, animation, visual effects, scientific rendering and virtual/augmented reality. The superior performance and greatly reduced cost will allow the same system to be used in the manufacturing industry, which requires high-resolution depth measurement. This technology will result in the broader adoption of non-contact 3D metrology and 3D machine vision for manufacturing quality control and defect inspection.The proposed project will develop a computational imaging system that allows for high-resolution 3D microgeometry and reflectance properties measurement of object surfaces. The current approaches for 3D surface measurement at the micron scale are based on sophisticated optical and mechanical components that are expensive and can be difficult to use, and most of these approaches cannot decouple the direct reflection and sub-surface scattering. The goal of this research program is to develop a combination of hardware and software that can measure 3D surface microgeometry and reflectance properties with micron-scale accuracy. The proposed technology is expected to achieve superior performance and greatly reduced cost.

这个小企业创新研究（SBIR）第一阶段项目的更广泛的影响/商业潜力可以导致在微米级物体表面的3D微观几何和反射特性测量的革命。所提出的技术将显着提高真实感渲染，并提高工作流程的效率，在基于物理的渲染。这可能会影响广泛的行业，包括视频游戏、产品可视化、动画、视觉效果、科学渲染和虚拟/增强现实。上级性能和大大降低的成本将允许相同的系统用于需要高分辨率深度测量的制造业。该技术将使非接触式3D测量和3D机器视觉更广泛地应用于制造质量控制和缺陷检测。拟议项目将开发一种计算成像系统，可以对物体表面进行高分辨率3D微观几何和反射特性测量。目前用于微米级3D表面测量的方法是基于昂贵且难以使用的复杂光学和机械部件，并且这些方法中的大多数不能解耦直接反射和子表面散射。这项研究计划的目标是开发一种硬件和软件的组合，可以测量3D表面微观几何形状和反射特性与微米级的精度。所提出的技术有望实现上级性能并大大降低成本。