SBIR Phase II: Advanced Computational Imaging System for 3D Surface Microgeometry and Reflectance Properties Measurement

小型企业创新研究(SBIR)第二阶段项目的广泛影响/商业潜力可能会导致微米级物体表面的3D微观几何和反射特性测量方面的一场革命。该技术将显著改善数字样机中的照片级真实感渲染，从而减少在设计、工程和制造过程中使用物理材料样本造成的浪费。这项技术将有助于减少产品开发时间和成本，并带来更大的可持续性。拟议的项目将开发一种计算成像系统，允许高分辨率的三维微观几何和物体表面的反射特性测量。目前用于微米级3D表面测量的方法是基于复杂的光学和机械组件，这些组件昂贵且难以使用，并且大多数方法不能捕获表面的全部外观，例如漫反射、镜面反射和表面粗糙度。这项研究计划的目标是开发一种硬件和软件相结合的方法，能够以微米级的精度测量3D表面的微观几何和反射特性。这项拟议的技术有望以极大的成本实现卓越的性能。这一奖项反映了NSF的法定使命，并通过使用基金会的智力优势和更广泛的影响审查标准进行评估，被认为值得支持。

The broader impact/commercial potential of this Small Business Innovation Research (SBIR) Phase II project can lead to a revolution in 3D microgeometry and reflectance properties measurement of object surfaces at the micron-scale range. The proposed technology will significantly improve photorealistic rendering in digital prototyping, and therefore reduce the waste from using physical material samples during design, engineering, and manufacturing. This technology will help reduce product development time and cost, and lead to a greater sustainability.The proposed project will develop a computational imaging system that allows for high-resolution 3D microgeometry and reflectance properties measurement of object surfaces. The current approaches for 3D surface measurement at the micron scale are based on sophisticated optical and mechanical components that are expensive and can be difficult to use, and most of these approaches cannot capture the full appearance of a surface, such as diffuse reflection, specular reflection, and surface roughness. The goal of this research program is to develop a combination of hardware and software that can measure 3D surface microgeometry and reflectance properties with micron-scale accuracy. The proposed technology is expected to achieve superior performance at greatly reduced cost.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.