CIF: Small: Sequential and Compound Estimation for Computational Imaging Systems

CIF：小型：计算成像系统的顺序和复合估计

基本信息

批准号：
1815896
负责人：
Vivek Goyal
金额：
$ 49.05万
依托单位：
Trustees of Boston University
依托单位国家：
美国
项目类别：
Standard Grant
财政年份：
2018
资助国家：
美国
起止时间：
2018-07-01 至 2022-06-30
项目状态：
已结题

来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=1815896&HistoricalAwards=false
关键词：
CIF Small Sequential Compound Estimation

项目摘要

The widespread use of imaging technologies across biology, chemistry, material science, medicine, and other fields is motivated by the great innate human ability for visual information processing. Imaging is often limited, however, by the damage to a sample caused by the imaging process, such as sputtering due to the incident ion or electron beam in scanned beam microscopy. With conventional methods, a sample may be destroyed before enough information has been gained to form a useful image. This project develops methods for reducing the necessary dose in microscopy systems. This may make it possible to image molecular or biological species not before imaged, or to increase the speed of imaging so that new dynamic phenomena are revealed. The project also includes dissemination of results to broad audiences through expository writing, general-audience talks, cross-disciplinary training, and production of teaching materials. Poisson models are often exploited when measured signals are due to small numbers of detected particles. A major premise of this project is to combine the Poisson modeling of such detection counts with Poisson modeling of the numbers of interacting particles in low-current beams. The project develops theory and methods for the resulting compound estimation problems. The project explores the use of time-resolved sensing to reduce the uncertainty due to the source shot noise in compound processes. Furthermore, time-resolved sensing enables the decomposition of a data collection process into a sequence of less-damaging steps, and the project will develop theory and methods for sequential estimation and adaptive data collection. Analysis will inspire and be informed by proof-of-concept experiments. The ultimate limit of learning about a sample without damaging it is achieved with certain quantum-mechanical interaction-free measurements. The project will develop theory for sequential interaction-free measurements to establish when they may be superior to conventional measurements.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

跨生物学，化学，材料科学，医学和其他领域的成像技术的广泛使用是由伟大的先天性视觉信息处理能力的动机。但是，成像通常受到成像过程引起的样品的损害，例如由于扫描束显微镜中的入射离子或电子束引起的溅射。使用常规方法，在获得足够的信息以形成有用的图像之前，可能会破坏样本。该项目开发了减少显微镜系统中必要剂量的方法。这可能使得不在成像之前成像分子或生物物种，或提高成像速度，从而揭示出新的动态现象。该项目还包括通过说明性写作，通用性谈话，跨学科培训以及教学材料的生产来传播结果。当测量信号是由于少量检测到的颗粒时，通常会利用泊松模型。该项目的主要前提是将这种检测计数的泊松建模与低电流梁中相互作用颗粒数量的泊松建模相结合。该项目为产生的复合估计问题开发了理论和方法。该项目探讨了时间分辨传感的使用，以减少复合过程中源射击噪声引起的不确定性。此外，时间分辨的感应将数据收集过程分解为一系列较小的步骤，该项目将开发理论和方法，以进行顺序估计和自适应数据收集。分析将通过概念验证实验启发并得知。通过某些无量子机械相互作用的测量结果，学习样品的最终学习限制是在不损害的情况下实现的。该项目将开发用于无互动测量的理论，以确定它们何时可能优于常规测量值。该奖项反映了NSF的法定任务，并使用基金会的智力优点和更广泛的审查标准，认为通过评估值得支持。

项目成果

期刊论文数量（23）

专著数量（0）

科研奖励数量（0）

会议论文数量（0）

专利数量（0）

Continuous-Time Modeling and Analysis of Particle Beam Metrology

DOI：
10.1109/jsait.2023.3283911
发表时间：
2023-03
期刊：
IEEE Journal on Selected Areas in Information Theory
影响因子：
0
作者：
A. Agarwal;Minxu Peng;V. Goyal
通讯作者：
A. Agarwal;Minxu Peng;V. Goyal

Beyond Binomial and Negative Binomial: Adaptation in Bernoulli Parameter Estimation

DOI：
10.1109/tci.2019.2913108
发表时间：
2018-09
期刊：
IEEE Transactions on Computational Imaging
影响因子：
5.4
作者：
Safa C. Medin;John Murray-Bruce;D. Castañón;Vivek K Goyal
通讯作者：
Safa C. Medin;John Murray-Bruce;D. Castañón;Vivek K Goyal

Denoising Particle Beam Micrographs With Plug-and-Play Methods

DOI：
10.1109/tci.2023.3282042
发表时间：
2022-08
期刊：
IEEE Transactions on Computational Imaging
影响因子：
5.4
作者：
Minxu Peng;Ruangrawee Kitichotkul;Sheila W. Seidel;Christopher C. Yu;V. Goyal
通讯作者：
Minxu Peng;Ruangrawee Kitichotkul;Sheila W. Seidel;Christopher C. Yu;V. Goyal

Offline Secondary Electron Counting and Conditional Re-illumination in SEM

SEM 中的离线二次电子计数和条件重照明

DOI：
10.1017/s1431927620017249
发表时间：
2020
期刊：
Microscopy and Microanalysis
影响因子：
2.8
作者：
Agarwal, Akshay;Simonaitis, John;Goyal, Vivek;Berggren, Karl
通讯作者：
Berggren, Karl

Online Beam Current Estimation in Particle Beam Microscopy

DOI：
10.1109/tci.2022.3182212
发表时间：
2021-11
期刊：
IEEE Transactions on Computational Imaging
影响因子：
5.4
作者：
Sheila W. Seidel;Luisa Watkins;Minxu Peng;A. Agarwal;Christopher C. Yu;V. Goyal
通讯作者：
Sheila W. Seidel;Luisa Watkins;Minxu Peng;A. Agarwal;Christopher C. Yu;V. Goyal