Transmission Electron Microscope-Nanoindenter for Nano-Mechanical Testing

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A transmission electron microscope (TEM)-nanoindenter enables us to record simultaneously the mechanical behaviour of materials under force and their structures and structural evolutions at sub-nanometre resolution. The acquisition of a TEM-nanoindenter will significantly enhance the capability of investigating the structural effect on the behaviour of materials under applied force, which is a key issue in materials science and engineering. The results obtained using the TEM-nanoindenter will reveal the fundamental origins of materials mechanical properties and will be used to improve materials processing procedures and to guide the design of stronger and lighter materials for structural applications.