In Situ TEM and Ex Situ Studies of Two-Dimensional Nanostructured Devices

二维纳米结构器件的原位 TEM 和异位研究

• 批准号: 1905045
• 负责人: Marija Drndic
• 金额: $ 67.27万
• 依托单位: University of Pennsylvania
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2019
• 资助国家: 美国
• 起止时间: 2019-08-15 至 2024-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1905045&HistoricalAwards=false
• 关键词: Situ; TEM; Ex; Studies; Two

Nontechnical Abstract:This NSF project focuses on an experimental investigation of novel two-dimensional nanostructured materials towards the fabrication and synthesis of one-dimensional electronic devices. This research combines fabrication of devices at the atomic scale in ultrathin materials with electrical characterization. The research team aims at advancing synthesis, characterization, and understanding of two-dimensional materials for an atom-by-atom control of structure-property-performance relationships while monitoring the evolution during device heating and electron irradiation and recording key device properties such as electron transport. More broadly, this project has impacts on education (university and K-12 students, on public forums: festivals and museum exhibits) and industry (e.g., on electron microscopy companies). The broader impact also includes the realization of low-dimensional materials and the advancement of devices including miniaturized electronics with improved power consumption. Moreover, this project impacts industries developing on-chip nanoscale devices. Outreach to a broad nanodevice community and to the electron microscopy industry includes open source software for analyzing data as well as the development of a novel equipment for advanced electron microscopy. The educational part provides innovative multidisciplinary learning opportunities for students at all levels, at the crossroads of electron microscopy and solid-state materials science in the Greater Philadelphia Area. To exploit the specific nature of this research project at the interface of physics and materials science, the PI's team participates in large public events in this metro area: the Nano Day at Penn, the Philadelphia Science Festival and the Philly Materials Day. The research team gives nanoscience presentations to high school students at the Penn Summer Science Academy and participates in the STEM outreach in the Philadelphia School District.Technical Abstract:This project exploits materials growth and materials irradiation by electron and ion beams to modify materials with nm-scale spatial and density control, towards engineering of their properties and observations of emerging phenomena that arise when material and device sizes are reduced and when single atomic layers of materials are stacked in a well-defined manner. This work establishes a more complete understanding of transport in low-dimensional materials that can enhance or replace silicon in future electronic-based devices. Thin atomic sheets are of particular interest since their electrical properties can be tuned by their geometry. Utilizing a novel experimental platform pioneered by the PI and state-of-the-art transmission electron microscopy instrumentation along with ex situ Raman spectroscopy, photoluminescence, and low temperature measurements, this project aims at understanding and controlling properties of thin materials such as nanosculpted structures for new multi-terminal electronic devices and few-nm-wide metal dichalcogenide nanoribbons. This research includes a comprehensive analysis toolkit enabling sub-angstrom device fabrication and atomically resolved property analysis. This work also advances device fabrication and characterization, thus opening the door to a wealth of unexplored physics. This research is organized into three primary cross-cutting themes: (1) growth, stacking, and electron microscopy characterization of two-dimensional layers and heterostructures, (2) electron beam nanosculpting and processing into one-dimensional nanodevices, and (3) nanodevice measurements. This project focuses on new materials including graphene, transition metal dichalcogenides (MoS2 and WS2) and topological thermoelectrics (Bi2Se3).This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

非技术摘要：这个NSF项目的重点是对一维电子器件的制造和合成的新型二维纳米结构材料的实验研究。这项研究结合了在电子材料的原子尺度上制造器件和电学特性。该研究小组旨在推进二维材料的合成，表征和理解，以逐个原子控制结构-性能-性能关系，同时监测器件加热和电子辐照期间的演变，并记录关键器件特性，如电子传输。更广泛地说，该项目对教育（大学和K-12学生，公共论坛：节日和博物馆展览）和工业（例如，电子显微镜公司）。更广泛的影响还包括实现低维材料和设备的进步，包括具有改进功耗的小型化电子设备。此外，该项目还影响了开发芯片上纳米级器件的行业。与广泛的纳米器件社区和电子显微镜行业的联系包括用于分析数据的开源软件以及用于先进电子显微镜的新型设备的开发。教育部分为各级学生提供创新的多学科学习机会，在大费城地区的电子显微镜和固态材料科学的十字路口。为了在物理学和材料科学的界面上利用这个研究项目的特殊性质，PI的团队参加了这个大都会地区的大型公共活动：宾夕法尼亚大学的纳米日，费城科学节和费城材料日。该研究团队在宾夕法尼亚大学夏季科学学院为高中生提供纳米科学演讲，并参与费城学区的STEM推广活动。技术摘要：该项目利用电子和离子束对材料生长和材料照射，以纳米尺度的空间和密度控制来修改材料，从而实现材料和设备尺寸减小时以及材料的单原子层以明确的方式堆叠时所产生的新现象的特性和观察。 这项工作建立了对低维材料中传输的更完整的理解，这些材料可以在未来的电子器件中增强或取代硅。薄的原子片特别令人感兴趣，因为它们的电性质可以通过它们的几何形状来调节。 利用PI和最先进的透射电子显微镜仪器沿着的非原位拉曼光谱，光致发光和低温测量开创的一种新的实验平台，该项目旨在了解和控制薄材料的性能，如纳米雕刻结构的新的多终端电子器件和几纳米宽的金属二硫属化物纳米带。这项研究包括一个全面的分析工具包，使亚埃器件制造和原子分辨性能分析。这项工作还推进了设备的制造和表征，从而为丰富的未探索的物理学打开了大门。本研究分为三个主要的交叉主题：（1）二维层和异质结构的生长，堆叠和电子显微镜表征，（2）电子束纳米雕刻和加工成一维纳米器件，（3）纳米器件测量。该项目专注于新材料，包括石墨烯，过渡金属二硫属化物（MoS 2和WS 2）和拓扑热电（Bi 2Se 3）。该奖项反映了NSF的法定使命，并通过使用基金会的知识价值和更广泛的影响审查标准进行评估，被认为值得支持。

项目成果

Controlled doping of graphene by impurity charge compensation via a polarized ferroelectric polymer

• DOI: 10.1063/5.0003099
• 发表时间: 2020-03
• 期刊: Journal of Applied Physics
• 影响因子: 3.2
• 作者: Kelotchi S. Figueroa;N. Pinto;Srinivas V. Mandyam;Meng-qiang Zhao;C. Wen;Paul Masih Das;Zhaoli Gao;M. Drndić;A. T. Charlie Johnson

Atomic-scale patterning in two-dimensional van der Waals superlattices

• DOI: 10.1088/1361-6528/ab596c
• 发表时间: 2020-03-06
• 期刊: NANOTECHNOLOGY
• 影响因子: 3.5
• 作者: Das, Paul Masih;Thiruraman, Jothi Priyanka;Drndic, Marija
• 通讯作者: Drndic, Marija

Gas flow through atomic-scale apertures

• DOI: 10.1126/sciadv.abc7927
• 发表时间: 2020-12-01
• 期刊: SCIENCE ADVANCES
• 影响因子: 13.6
• 作者: Thiruraman, Jothi Priyanka;Dar, Sidra Abbas;Radha, Boya
• 通讯作者: Radha, Boya

Computer vision AC-STEM automated image analysis for 2D nanopore applications

适用于 2D 纳米孔应用的计算机视觉 AC-STEM 自动图像分析

• DOI: 10.1016/j.ultramic.2021.113249
• 发表时间: 2021
• 期刊: Ultramicroscopy
• 影响因子: 2.2
• 作者: Chen, Joshua;Balan, Adrian;Masih Das, Paul;Thiruraman, Jothi Priyanka;Drndić, Marija
• 通讯作者: Drndić, Marija