CAREER: Investigating the Impact of Device Aging on the Security of Cryptographic Chips
CAREER: Investigating the Impact of Device Aging on the Security of Cryptographic Chips
批准号:
1943224
负责人:
Naghmeh Karimi
金额:
$49.97万
依托单位国家:
美国
项目类别:
Continuing Grant
财政年份:
2020
资助国家:
美国
项目状态:
未结题
起止时间:
2020-07-01 至 2025-06-30
中文摘要
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英文摘要
Cryptographic chips implement cryptographic functions in hardware for better performance. Despite the significant performance benefits, cryptographic chips can be compromised by the adversaries via monitoring their power-consumption, tampering their logic or placing the chips under stress to generate erroneous outputs to infer sensitive data. The current protections against such attacks do not consider aging of the devices that can cause parametric shift of device parameters over time. Device aging may potentially compromise device security. This project will investigate the the effects of device aging on the security of cryptographic devices.The goal of this project is to understand the aging-related risks that compromise security of cryptographic devices, particularly those with protection against physical attacks and develop solutions to ensure security when device aging comes into account. This project will focus on the following threats and investigate how aging can affect them: (i) The state-of-the-art side-channel analysis attacks; (ii) The state-of-the-art fault-injection attacks; and (iii) Hardware Trojans whose activation can be facilitated/hardened due to aging. It will target the shortcomings of these schemes and develop aging-resilient countermeasures to circumvent side-channel and fault-injection attacks. This project will also investigate aging-aware Trojan detection solutions.The success of this project will enable the development of long-lasting security for trusted hardware platforms, and result in aging-resistant security solutions that benefit the society via devices that remain secure over their lifetime. To attract graduate, undergraduate, and underrepresented students to hardware security and cryptography research and education, this project will develop a new course on cryptography, hardware security, and testing. Tutorials will be conducted and internships on hardware security will be offered to undergraduate students. This project will also seek to attract underrepresented minorities. Lectures on hardware security will be organized for Cristo Rey Jesuit high-school students. The project repository will be stored electronically and made available through the website hosted by the University of Maryland Baltimore County, department of Computer Science and Electrical Engineering (https://www.csee.umbc.edu/~nkarimi/). The data will be retained for a period of at least five years following the end of the grant period.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.
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On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits
老化对针对功率均衡密码电路的功率分析攻击的影响
DOI:
--
发表时间:
2021
期刊:
Proceedings of the ASPDAC Asia and South Pacific Design Automation Conference
影响因子:
--
作者:
[Anik, Md Toufiq, Fadaeinia, Bijan, Moradi, Amir, Karimi, Naghmeh]
通讯作者:
Karimi, Naghmeh
DOI:
10.1109/vts56346.2023.10140057
发表时间:
2023
期刊:
IEEE VLSI Test Symposium (VTS
影响因子:
--
作者:
[Bahrami, Javad, Ebrahimabadi, Mohammad, Danger, Jean-Luc, Guilley, Sylvain, Karimi, Naghmeh]
通讯作者:
Karimi, Naghmeh
DOI:
10.1007/s10836-021-05976-8
发表时间:
2021-12
期刊:
Journal of Electronic Testing
影响因子:
--
作者:
[Md Toufiq Hasan Anik;Mohammad Ebrahimabadi;J. Danger;S. Guilley;Naghmeh Karimi]
通讯作者:
Md Toufiq Hasan Anik;Mohammad Ebrahimabadi;J. Danger;S. Guilley;Naghmeh Karimi
Leakage Power Analysis in Different S-Box Masking Protection Schemes
不同S-Box掩蔽保护方案中的泄漏功率分析
DOI:
10.23919/date54114.2022.9774763
发表时间:
2022
期刊:
Automation and Test in Europe Conference (DATE
影响因子:
--
作者:
[Bahrami, Javad, Ebrahimabadi, Mohammad, Danger, Jean-Luc, Guilley, Sylvain, Karimi, Naghmeh]
通讯作者:
Karimi, Naghmeh
DOI:
10.1109/isqed54688.2022.9806232
发表时间:
2022
期刊:
IEEE Int'l Symp. on Quality Electronic Design
影响因子:
--
作者:
[Ebrahimabadi, Mohammad, Fadaeinia, Bijan, Moradi, Amir, Karimi, Naghmeh]
通讯作者:
Karimi, Naghmeh
共 7 条
Student Travel Support for 2018 IEEE VLSI Test Symposium
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批准号:1822089
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项目类别:Standard Grant
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资助金额:$1.2万
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财政年份:2018
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负责人:Naghmeh Karimi
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依托单位:
海外基金