Comprehensive Analysis Facility for Thin Films and Surfaces

薄膜和表面综合分析设备

• 批准号: LE0882246
• 负责人: Prof Marcela Bilek
• 金额: $ 50.01万
• 依托单位: The University of Sydney
• 依托单位国家: 澳大利亚
• 项目类别: Linkage Infrastructure, Equipment and Facilities
• 财政年份: 2008
• 资助国家: 澳大利亚
• 起止时间: 2008-04-14 至 2009-04-13
• 项目状态: 已结题
• 来源: https://dataportal.arc.gov.au/RGS/Web/Grants/LE0882246
• 关键词: Comprehensive; Analysis; Facility; Thin; Films

The provision of infrastructure for the analysis of thin films will enhance Australia's capabilities in creating new materials and in creating new devices that meet needs in medicine, communications, the environment and security. As devices become smaller, sufaces and interfaces dominate their performance. The new facility will enable researchers to understand the structure and composition of the interior and interfaces of thin films as well as mapping local variations in their key properties. Instruments with unique capabilities will measure elemental composition, crystallographic phase, defect and void distributions and spatially resolved stress, electrical, mechanical and magnetic properties.

为薄膜分析提供基础设施将提高澳大利亚创造新材料和创造新设备的能力，以满足医药、通信、环境和安全方面的需要。随着设备变得越来越小，表面和接口决定了它们的性能。新设施将使研究人员能够了解薄膜内部和界面的结构和组成，并绘制其关键特性的局部变化。具有独特功能的仪器将测量元素成分、晶相、缺陷和空隙分布以及空间分辨的应力、电、机械和磁特性。