National Facility for High Resolution CL Analysis of Photovoltaic and Optoelectronic Devices

点击翻译按钮获取中文摘要

To establish a National Facility for High Resolution Cathodoluminescence (CL) analysis of photovoltaic and optoelectronic devices. The facility will enable university and industrial researchers to correlate luminescence with defects, microstructure and composition down to the nanoscale. The facility will comprise: 1. CL on a dual beam Scanning Electron Microscope (SEM) equipped with a Xenon plasma Focused Ion Beam (FIB). The Xe FIB will be used to extract lamellae from features detected in the SEM-CL for high resolution Transmission Electron Microscope analysis.2. CL on a dedicated Scanning Transmission Electron Microscope (STEM) for nanoscale analysis.The facility will be unique world-wide and help maintain the UK's position as a research leader in photovoltaic and optoelectronic device development.