Development of a fast and quantitative diffraction analysis of crystallite size distributions

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We propose a new fast diffractometric method to determine crystallite size distributions (CSDs) for applications in material science. The method is based on measurements of spotty Deby-Scherrer rings obtained by X-ray diffraction using two-dimensional detectors. The individual diffraction spots will be analyzed in an automated fashion using a Python open source code, developed for this purpose. The absolute calibration of the intensity will be done using a standard material measured under identical conditions. The method will be applicable to both laboratory and synchrotron X-ray sources and thus extends the operational range of recently published work by other groups. Moreover, what concerns the CSD determination our approach will deliver more accurate results as corrections for the beam inhomogeneity as well as absorption effects will be implemented. The method will be applied to polycrystalline materials to study the effects of recrystallisation and grain growth and bears a large and presently underexploited potential to better quantify these processes.