Development of a fast and quantitative diffraction analysis of crystallite size distributions

我们提出了一种新的快速测定微晶尺寸分布(CSD)的方法，在材料科学中的应用。该方法是基于使用二维探测器对X射线衍射获得的斑点Deby-Scherrer环进行测量的。单独的衍射点将使用为此目的开发的Python开放源代码以自动方式进行分析。强度的绝对校准将使用在相同条件下测量的标准材料进行。该方法将适用于实验室和同步加速器X射线源，从而扩大了其他小组最近发表的工作的操作范围。此外，与CSD确定有关的是，我们的方法将提供更准确的结果，因为将实施对光束不均匀性以及吸收效应的校正。该方法将应用于多晶材料，以研究再结晶和颗粒生长的影响，并具有更好地量化这些过程的巨大且目前未被开发的潜力。

We propose a new fast diffractometric method to determine crystallite size distributions (CSDs) for applications in material science. The method is based on measurements of spotty Deby-Scherrer rings obtained by X-ray diffraction using two-dimensional detectors. The individual diffraction spots will be analyzed in an automated fashion using a Python open source code, developed for this purpose. The absolute calibration of the intensity will be done using a standard material measured under identical conditions. The method will be applicable to both laboratory and synchrotron X-ray sources and thus extends the operational range of recently published work by other groups. Moreover, what concerns the CSD determination our approach will deliver more accurate results as corrections for the beam inhomogeneity as well as absorption effects will be implemented. The method will be applied to polycrystalline materials to study the effects of recrystallisation and grain growth and bears a large and presently underexploited potential to better quantify these processes.