Surface Analysis Platform: X-Ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) (Z01)

表面分析平台：X射线光电子能谱（XPS）和飞行时间二次离子质谱（ToF-SIMS）（Z01）

• 批准号: 283793724
• 金额: --
• 依托单位: Institut für Anorganische Chemie (aoc)
• 依托单位国家: 德国
• 项目类别: Collaborative Research Centres
• 财政年份: 2016
• 资助国家: 德国
• 起止时间: 2015-12-31 至 2019-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/283793724?language=en
• 关键词: Surface; Analysis; Platform; Ray; Photoelectron

The Surface Analysis Platform combines complementary XPS and ToF-SIMS with Ar cluster ion sputter depth profiling to quantitatively evidence every single reaction step of the macromolecular synthesis routes on various substrates and to evidence 3D structures at high spatial resolution. For all subprojects of section B and C, individual approaches will be adapted to prevent method induced damage. If necessary, NEXAFS and FE-SEM are available to corroborate the results. Thus, the platform will provide quantitative chemical and molecular information on the chemical and geometrical integrity of the prepared structures and modifications.

表面分析平台将互补的XPS和ToF-SIMS与Ar团簇离子溅射深度分析相结合，以定量证明各种基底上大分子合成路线的每个反应步骤，并以高空间分辨率证明3D结构。对于B和C部分的所有子项目，将采用个别方法，以防止方法引起的损坏。如有必要，NEXAFS和FE-SEM可用于证实结果。因此，该平台将提供关于所制备的结构和修饰的化学和几何完整性的定量化学和分子信息。