Surface Analysis Platform: X-Ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) (Z01)

表面分析平台将互补的XPS和ToF-SIMS与Ar团簇离子溅射深度剖析相结合，在各种衬底上定量证明大分子合成路线的每一个反应步骤，并在高空间分辨率下证明3D结构。对于B部分和C部分的所有子项目，将采用单独的方法来防止方法造成的损害。如有必要，可使用NEXAFS和FE-SEM来证实结果。因此，该平台将提供有关所制备结构和修饰的化学和几何完整性的定量化学和分子信息。

The Surface Analysis Platform combines complementary XPS and ToF-SIMS with Ar cluster ion sputter depth profiling to quantitatively evidence every single reaction step of the macromolecular synthesis routes on various substrates and to evidence 3D structures at high spatial resolution. For all subprojects of section B and C, individual approaches will be adapted to prevent method induced damage. If necessary, NEXAFS and FE-SEM are available to corroborate the results. Thus, the platform will provide quantitative chemical and molecular information on the chemical and geometrical integrity of the prepared structures and modifications.