Effect of Chemo-Mechanical Grinding on Surface Integrity of Single Crystal Silicon Substrates
Effect of Chemo-Mechanical Grinding on Surface Integrity of Single Crystal Silicon Substrates
批准号:
LX0776049
负责人:
Prof Han Huang
金额:
$3.43万
依托单位国家:
澳大利亚
项目类别:
Linkage - International
财政年份:
2007
资助国家:
澳大利亚
项目状态:
已结题
起止时间:
2007-01-01 至 2010-03-31
中文摘要
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英文摘要
Silicon substrates or wafers are extensively used in electronic and optic/photonic industries. A long-time standing problem in silicon wafer machining is the surface and subsurface damage induced by machining. This may significantly affect the mechanical, optical and electronic characteristics of wafer-based components. The issue becomes increasingly more critical as the application of silicon wafers is extending further as structural components. The research outcomes will contribute an improved understanding of Chemo Mechanical Grinding process and help to develop innovative technologies for silicon industries.
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