Analysis, Optimization, and Control of Scanning Atomic Force Microscope Micro-Cantilever Probes

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Atomic Force Microscopes (AFM's) are widely used for the examination of samples smaller than can be observed with an optical microscope. A tiny 'finger', only a few atoms wide at its sharpest point, is used to 'feel' the surface of a sample. This project aims to increase the resolution of AFM images by actively controlling the sensor probe dynamics. Better quality AFM images would allow scientists to further investigate the atomic and molecular structure of such samples as: metals, polymers, cells, and proteins. This research will contribute to the design of an Australian made Scanning Probe Microscope. Development of local expertise will provide a valuable resource for Australian scientific and industrial research.