Wavelength-dispersive X-Ray fluorescence spectrometer

波长色散X射线荧光光谱仪

• 批准号: 425899429
• 金额: --
• 依托单位: Lehrstuhl für Technische Chemie I
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2019
• 资助国家: 德国
• 起止时间: 2018-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/425899429?language=en
• 关键词: Wavelength; dispersive; Ray; fluorescence; spectrometer

The aim of this proposal is to equip the Faculty of Chemistry of the University of Duisburg-Essen with a high-performance wavelength-dispersive X-ray fluorescence spectrometer (WD-RFA) in order to further expand and utilize the University's excellence in fundamental and applied research on nanoscience and nanomaterials. The non-destructive quantification of the elemental composition obtained by solid nanocomposites and thin-film samples as well as liquid nanoparticle colloids represents a major challenge in the scientific life of our faculty. The main research areas range from the synthesis and development of functional biomaterials to inorganic multi-metallic alloy nanomaterials in the field of optics (SFB 1242) and magnetism towards tailor-made nanoparticle colloids and composites for additive manufacturing (SPP 2122) and fundamental research on heterogeneous catalysts (SFB / TR 247). Already available non-destructive methods such as e.g. EDX, EELS, AES or XPS have only limited sensitivity (> 100 ppb) and are therefore not suitable for trace analysis as well as liquid samples. In turn, alternative quantitative methods such as ICP-OES / -MS or AAS, require that the composition is at least qualitatively known in order to apply a tailored sample preparation method (including destructive sample digestion) including time-consuming microwave digestion. Consequently, a study of the material composition is only possible on a small sample scale, is associated with a loss of sample and enables only indirect composition-related correlations. The performance profile of the WD-RFA described in this proposal is designed to ensure a non-destructive analysis of solid and liquid nanomaterials, possible in trace amounts (down to 1 ppb) even in case of unknown composition as well as high sample throughput. Within the Faculty of Chemistry, the proposed WD-RFA will hence provide a valuable tool to carry out urgently needed direct correlations between the material composition and measured intrinsic material properties as well as application-related parameters.

这项建议的目的是为杜伊斯堡-埃森大学化学系配备一台高性能波长色散X射线荧光光谱仪(WD-RFA)，以进一步扩大和利用该大学在纳米科学和纳米材料基础和应用研究方面的优势。通过固体纳米复合材料和薄膜样品以及液体纳米颗粒胶体获得的元素组成的非破坏性定量是我们教员科学生活中的一个重大挑战。主要研究领域从功能生物材料的合成和开发到光学领域的无机多金属合金纳米材料(SFB 1242)和磁性到用于添加剂制造的定制纳米粒子胶体和复合材料(SPP 2122)和多相催化剂的基础研究(SFB/TR247)。现有的非破坏性方法，如EDX、EELS、AES或XPS，灵敏度有限(&gt；100 ppb)，因此不适合痕量分析和液体样品。反过来，替代的定量方法，如电感耦合等离子体发射光谱仪/电感耦合等离子体质谱或原子吸收光谱分析，要求成分至少是定性已知的，以便应用包括耗时的微波消解在内的量身定制的样品制备方法(包括破坏性样品消解)。因此，对材料成分的研究只能在小样本范围内进行，与样品的损失有关，并且只能实现与成分相关的间接关联。本建议中描述的WD-RFA的性能曲线旨在确保对固体和液体纳米材料进行无损分析，即使在成分未知和样品吞吐量较高的情况下也可以进行微量分析(最低可达1 ppb)。因此，在化学系内部，拟议的WD-RFA将提供一个宝贵的工具，用于在材料成分和测量的材料固有性能以及与应用相关的参数之间进行迫切需要的直接关联。