Atomic scale imaging and manipulation of transition metal oxides (C07*)

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Project C7 will approach the ultimate scaling limits by analyzing the factors determining the filament for-mation and stabilization at the atomic scale. These scalability limits arise from the size of a reliably switching filament and its maximal density and will be analyzed on defect engineered epitaxial thin films (from C2) and crystalline nanoparticles (from C1). SPM methods will be employed to study the change of the surface morphology and the electronic properties during the switching process. Besides crystal stoi-chiometry of the crystal phases, surface adsorbates will be evaluated regarding their potential facilitation of filament formation and dissolution.