Fundamental study on spherical aberration correction of the objective lens of an electron microscope using a foil lens

箔透镜电子显微镜物镜球差校正的基础研究

基本信息

  • 批准号:
    05650051
  • 负责人:
  • 金额:
    $ 1.54万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for General Scientific Research (C)
  • 财政年份:
    1993
  • 资助国家:
    日本
  • 起止时间:
    1993 至 1994
  • 项目状态:
    已结题

项目摘要

1. Development of a foil lens for the objective lens of a transmission electron microscope (TEM) : In order to design the foil lens with the optimum characteristics in spherical aberration correction, spherical aberration coefficients were calculated for variable geometries of the foil lens. It was found that the correction is achieved by locating the foil lens close to the lower polepiece and making the diameter of the electrode aperture as small as 0.3mm. A side-entry type foil lens was developed based on the calculation. A device for heating the foil was incorporated to avoid contamination build-up on the foil due to intense transmitted electron beam focused on it.2. Measurements of spherical aberration of the corrected objective lens : The spherical aberration was measured from the deviation of dark-field TEM images of MgO particles from the corresponding bright-field image. The spherical aberration decreased as the foil lens voltage was increased up to 600 V and became negative at … More 800 V.A small spherical aberration caused around the optimum foil lens voltage, however, could not be measured because the dark-field image of MgO quickly fades out at high magnifications due to radiation damage. Fine gold particles which is not sensitive to electron irradiation, therefore, were observed around the optimum voltage at sufficiently high magnifications, which also enabled us to reduce the error in measured spherical aberrations caused by defocus because the defocus effect was detected from the phase contrast of the carbon supporting film. At the foil lens voltage of 615 V the deviation of the dark-field image disappeared, which proved the correction of spherical aberration.3. Construction of an optical Fourier transform system for measurements of spherical aberration coefficients. : In order to investigate the performance of the foil lens not only at single diffraction angle but over a wide range of the aperture angle, an optical Fourier transform system, which consists of a diffractmeter and a computer for data treatments, was constructed. The spherical aberration coefficients were accurately measured from spatial frequencies providing maxima and minima in the power spectrum of TEM images of thin carbon films. Less
1.透射式电子显微镜物镜用箔片透镜的研制:为了设计出具有最佳球差校正特性的箔片透镜,计算了不同几何形状的箔片透镜的球差系数。结果表明,通过将箔片透镜放置在靠近下极镜的位置,并将电极孔径缩小到0.3 mm,就可以实现校正。在此基础上研制了侧入口式箔片透镜。加入了一个加热铝箔的装置,以避免由于聚焦在其上的强烈透射式电子束而在铝箔上积聚污染。校正物镜球差的测量:球差的测量是根据氧化镁颗粒的暗场透射电子显微镜图像与相应的亮场图像的偏差来测量的。当箔透镜电压增加到600V时,球差减小,在…时球差变为负然而,在最佳箔片透镜电压附近产生的小球差不能测量到800V以上,因为由于辐射损伤,在高倍率下,氧化镁的暗场图像很快就消失了。因此,在足够高的放大率下,在最佳电压附近观察到对电子照射不敏感的细小的金粒子,这也使我们能够减少由于离焦引起的球差测量误差,因为离焦效应是从碳支撑膜的相位对比度中检测到的。当箔透镜电压为615V时,暗视场图像的偏差消失,证明了球差的校正。光学傅里叶变换球差系数测量系统的构建。为了研究箔片透镜在单一衍射角和较宽口径范围内的性能,建立了由衍射仪和数据处理计算机组成的光学傅里叶变换系统。球差系数的准确测量提供了空间频率的最大值和极小值的功率谱的薄膜碳膜。较少

项目成果

期刊论文数量(31)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
日比野 倫夫: "Detection system for fast STEM elemental mapping using parallel EELS with a moderate-scale detecter" Microbeam Analysis. 3. 299-303 (1994)
Michio Hibino:“使用带有中等规模探测器的并行 EELS 进行快速 STEM 元素映射的检测系统”微束分析。 3. 299-303 (1994)
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日比野倫夫: "Detection System for Fast STEM Elemental Mapping Using Parallel EELS with a Moderate-Scale Detector" Microbeam Analysis. 3. 299-303 (1994)
Michio Hibino:“使用带有中等规模探测器的并行 EELS 进行快速 STEM 元素映射的检测系统”微束分析。 3. 299-303 (1994)
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花井孝明: "Characteristics and effectiveness of a foil lens in correcting the spherical aberration of electron probe instruments" Proc.4th Int.Conf.Charged Particle Optics. 226-227 (1994)
Takaaki Hanai:“箔透镜校正电子探针仪器球差的特性和有效性”Proc.4th Int.Conf.Charged Particle Optics 226-227 (1994)。
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花井 孝明: "最大エントロピー法を用いた画像処理のSTEMへの応用" 日本電子顕微鏡学会「電子顕微鏡による材料研究のための新手法」研究部会予稿集. 16-20 (1993)
Takaaki Hanai:“使用最大熵方法进行图像处理在 STEM 中的应用”日本电子显微镜学会“使用电子显微镜进行材料研究的新方法”研究组论文集 16-20 (1993)。
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Shigeyasu TANAKA: "Electron microscopy study of modulated structure in LPE-grown InGaAsP epitaxial layrs lattece matched on (001) GaAs" Electron Microscopy 1994. 1. 617-618 (1994)
Shigeyasu TANAKA:“在 (001) GaAs 上匹配的 LPE 生长的 InGaAsP 外延层晶格中调制结构的电子显微镜研究” 电子显微镜 1994. 1. 617-618 (1994)
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HANAI Takaaki其他文献

HANAI Takaaki的其他文献

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{{ truncateString('HANAI Takaaki', 18)}}的其他基金

Improvement of Resolution of a Electron Microscope by Means of Correction of Spherical Aberration Using a Foil Lens
通过使用箔透镜校正球面像差来提高电子显微镜的分辨率
  • 批准号:
    11650055
  • 财政年份:
    1999
  • 资助金额:
    $ 1.54万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Research on a Structure Analysis of Materials with a Maximum Entropy Restoration of Electron Microscope Images.
电子显微镜图像最大熵恢复材料结构分析研究。
  • 批准号:
    09650063
  • 财政年份:
    1997
  • 资助金额:
    $ 1.54万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Research on an Improvement of Resolution of Electron Microscope by Means of Maximum Entropy Image Restoration.
利用最大熵图像恢复提高电子显微镜分辨率的研究。
  • 批准号:
    07650395
  • 财政年份:
    1995
  • 资助金额:
    $ 1.54万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Development of a high resolution scanning transmission electron microscope with a foil lens for correction of spherical aberration
开发带有箔透镜的高分辨率扫描透射电子显微镜,用于校正球面像差
  • 批准号:
    05555099
  • 财政年份:
    1993
  • 资助金额:
    $ 1.54万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research (B)

相似海外基金

Development of Spherical Aberration Correction Technique for Electron Optical Systems using an Annular Objective Pupil and an Auxiliary Proximity Electrode
使用环形物镜光瞳和辅助接近电极开发电子光学系统球差校正技术
  • 批准号:
    24360020
  • 财政年份:
    2012
  • 资助金额:
    $ 1.54万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
Real time spherical aberration correction with high resolution transmission election microscope based on active image processing method
基于主动图像处理方法的高分辨率透射电镜实时球差校正
  • 批准号:
    61550041
  • 财政年份:
    1986
  • 资助金额:
    $ 1.54万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (C)
Developemtn of High Resolution Scanning Transmission Electron Microscope through Spherical Aberration Correction by Means of a Foil Lens
箔透镜球差校正高分辨率扫描透射电子显微镜的研制
  • 批准号:
    61850069
  • 财政年份:
    1986
  • 资助金额:
    $ 1.54万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research
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