Development of a high resolution scanning transmission electron microscope with a foil lens for correction of spherical aberration
Development of a high resolution scanning transmission electron microscope with a foil lens for correction of spherical aberration
批准号:
05555099
负责人:
HANAI Takaaki
金额:
$4.74万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Developmental Scientific Research (B)
财政年份:
1993
资助国家:
日本
项目状态:
已结题
起止时间:
1993 至 1995
中文摘要
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英文摘要
1. Development of a foil lens for the scanning transmission electron microscope (STEM) : In order to design the foil lens with the optimum characteristics, the third and fifth order spherical aberration coefficients were calculated. It was found that the correction is achieved at a practical foil lens voltage by making the diameter of the electrode aperture as small as 0.4mm. A side-entry type foil lens was developed based on the calculation.2. Construction and optimization of the system for detection of signal electrons : A detection system of signal electrons was optimized with a bright field/dark field detector. When electrons leaving the specimen at angles up to 26 mrad were detected, electrons acattered by the foil of the foil lens with angles of larger than 6.3 mrad were screened by a detection aperture diaphragm and images of high signal-to noise ratios.3. Measurements and evaluation of correction characteristics of the foil lens : The newly developed foil lens was operated in S … More TEM and the spherical aberration coefficient was measured with shadow image method. The spherical aberration coefficient decreased as the foil lens voltage was increased and turned negative at around 350 V.The measured spherical aberration coefficients were in good agreement with the calculation when the fifth order spherical aberration was taken into account, which proved the correction of spherical aberration.4. Observation of STEM images with the foil lens : Fine gold particles were observed with and without the foil lens at the accelerating voltage of 200 kV,and the images were compared. Fine particles of a smaller distance were resolved with the foil lens and, therefore, an improvement of resolution using the foil lens was shown for the first time.5. Evaluation from calculated current density distributions of the electron probe : For evaluation of the result of the correction experiment, the probe profile was calculated wave-optically. The profile for the foil lens voltage of 350 V was nearly the same as the ideal profile without any aberrations. The optimum voltage was in good agreement with the experimental one giving the highest resolution, which suggests that almost perfect correction was obtained. Less
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Takaaki Hanai: "Improvement of Maximum Entropy Method for Reduction of the Statistical Noise in Electron Microscope Images" Electron Microscopy 1994. 1. 435-436 (1994)
Takaaki Hanai:“改进最大熵方法以减少电子显微镜图像中的统计噪声” Electron Microscopy 1994. 1. 435-436 (1994)
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花井 孝明: "Improvement of Maximum Entropy Method for Reduction of the Statistical Noise in Electron Microscope Images" Electron Microscopy 1994. 1. 435-436 (1994)
Takaaki Hanai:“改进最大熵方法以减少电子显微镜图像中的统计噪声” Electron Microscopy 1994. 1. 435-436 (1994)
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Michio Hibino: "Detection System for Fast STEM Elemental Mapping Using Parallel EELS with a Moderate-Scale Detector" Microbeam Analysis. 3. 299-303 (1994)
Michio Hibino:“使用带有中等规模探测器的并行 EELS 进行快速 STEM 元素映射的检测系统”微束分析。
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Takaaki Hanai: "Increase of Current Density of the Electron Probe by Correction of the Spherical Aberration with a Side-entry Type Foil Lens" Journal of Electron Microscopy. 44. 301-306 (1995)
Takaaki Hanai:“通过使用侧入型箔透镜校正球面像差来增加电子探针的电流密度”电子显微镜杂志。
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Michio Hibino: "Formation of Fine Electron Probe by Correction of the Spherical Aberration and Its Application to STEM" Proc.1st China-Japan Joint Symposium on Microbeam Analysis. 33-38 (1994)
日比野道雄:“通过球差校正形成精细电子探针及其在 STEM 中的应用”,第一届中日微束分析联合研讨会论文集。
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共 24 条
Improvement of Resolution of a Electron Microscope by Means of Correction of Spherical Aberration Using a Foil Lens
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批准号:11650055
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.24万
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财政年份:1999
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负责人:HANAI Takaaki
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依托单位:
Research on a Structure Analysis of Materials with a Maximum Entropy Restoration of Electron Microscope Images.
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批准号:09650063
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.05万
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财政年份:1997
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负责人:HANAI Takaaki
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依托单位:
Research on an Improvement of Resolution of Electron Microscope by Means of Maximum Entropy Image Restoration.
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批准号:07650395
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$1.34万
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财政年份:1995
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负责人:HANAI Takaaki
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依托单位:
Fundamental study on spherical aberration correction of the objective lens of an electron microscope using a foil lens
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批准号:05650051
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项目类别:Grant-in-Aid for General Scientific Research (C)
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资助金额:$1.54万
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财政年份:1993
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负责人:HANAI Takaaki
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依托单位:
海外基金