X-ray Diffractometer for Thin Film Analysis

用于薄膜分析的 X 射线衍射仪

• 批准号: 433623002
• 金额: --
• 依托单位: Technische Universität München (TUM)
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2019
• 资助国家: 德国
• 起止时间: 2018-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/433623002?language=en
• 关键词: ray; Diffractometer; Thin; Film; Analysis

Funding is requested for an X-ray diffractometer for advanced analysis of semiconductor thin films and heterostructures. The system will be installed at the Walter Schottky Institute, Technical University of Munich (TUM), and will be a key characterization tool in the PI’s research dedicated to the development of nitride, oxynitride, and hybrid organic-inorganic perovskite materials with application for solar energy conversion. These materials are prepared through a range of deposition techniques available in the PI’s research group, including reactive sputtering, atomic layer deposition, molecular beam epitaxy, and spin coating. A reliable and versatile X-ray diffractometer will be used to acquire structural information, including phase, strain, texture, and mosaicity. Results will provide feedback for the optimization of deposition procedures. In addition, an in situ temperature-controlled stage will be used to monitor the evolution of these properties at elevated temperature, as well as phase transformations at low temperature. Initial research projects will include: i) Development of p-type transition metal nitrides for solar energy capture, ii) Understanding composition-structure-function relationships in defect-engineered hybrid organic-inorganic perovskites, iii) Elucidation of optoelectronic properties and photochemical characteristics of (GaN)1-x(ZnO)x thin films grown by molecular beam epitaxy, and iv) Group III-N semiconductor-based heterostructures and nanosystems. The specifications of the proposed X-ray diffractometer are chosen to maximize scientific flexibility and, thus, value.

请求提供资金，以购置一台用于半导体薄膜和异质结构高级分析的X射线衍射仪。该系统将安装在慕尼黑工业大学（TUM）的Walter Schottky研究所，并将成为PI研究的关键表征工具，致力于开发氮化物，氮氧化物和混合有机-无机钙钛矿材料，并应用于太阳能转换。这些材料是通过PI研究小组提供的一系列沉积技术制备的，包括反应溅射、原子层沉积、分子束外延和旋涂。一个可靠的和多功能的X射线衍射仪将用于获取结构信息，包括相位，应变，纹理和镶嵌性。结果将为沉积工艺的优化提供反馈。此外，原位温度控制阶段将用于监测这些性能在高温下的演变，以及在低温下的相变。初步研究项目将包括：i）开发用于太阳能捕获的p型过渡金属氮化物，ii）理解缺陷工程混合有机-无机钙钛矿的组成-结构-功能关系，iii）阐明通过分子束外延生长的（GaN）1-x（ZnO）x薄膜的光电特性和光化学特性，以及iv）基于III-N族半导体的异质结构和纳米系统。所建议的X射线衍射仪的规格选择是为了最大限度地提高科学灵活性，从而提高价值。