Acquisition of an X-ray Diffractometer for the Study of Thin Films and Nanostructured Materials

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ABSTRACT CTS-9871147 Hadis Morkoc, Gary E. Wnek, Mohamed S. El-Shall, Alison A. Baski, John A. Carlisle Srinivasan Virginia Commonwealth University Title: Acquisition of an X-Ray Diffractometer for the Study of Thin Films and Nanostructured Materials The Virginia Microelectronics Center at the Virginia Commonwealth University will purchase a Philips X'PERT Materials Research Diffractometer for the study of nanostructured materials, research training of graduate and undergraduate students in Electrical Engineering, Physics, Chemistry, and Chemical Engineering, and for materials characterization training of students of semiconductor science and technology. The instrument will be made available to local community colleges and high schools. Research projects will include: deposition of In,Al-GaN heterostructures by molecular beam epitaxy and organometallic vapor phase epitaxy (Morkoc); structure of thin-film semiconductor/metal multilayers (Carlisle and Baski); structure of oxide and nitride nanoparticles (El-Shall); microphase structure of ion-conducting self-assembling block copolymer films (Wnek). The university will match 47% of the instrument cost. The apparatus will be managed by Dr. Morkoc.