Powder X-Ray Diffractometer Tailored for Thin Film Measurements

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My research program focuses on the fabrication and characterization of thin films for solar fuels applications. This application for a Rigaku SmartLab X-ray diffractometer bearing powder XRD focusing beam (FB) optics, thin-film parallel beam (PB) optics and X-ray reflectometry (XRR) is tailored to meet our needs of accurately measuring crystallinity, surface roughness and thickness of our thin films. The extent of film crystallinity and morphology has a direct impact on the performance of our solar energy conversion devices and this measurement system is uniquely equipped with to analyze the films with the requisite sensitivity. This equipment will be unique to the UBC campus, and will enable entry into fundamentally new areas of research that are otherwise inaccessible to us. The equipment will provide an invaluable tool to other research groups as well as industry.