Selectivity inversion in plasma processing at low temperatures
Selectivity inversion in plasma processing at low temperatures
批准号:
04805029
负责人:
MATSUURA Takashi
金额:
$1.34万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for General Scientific Research (C)
财政年份:
1992
资助国家:
日本
项目状态:
已结题
起止时间:
1992 至 1993
中文摘要
随着用于硅LST的超细图案器件制造技术的进步,低温等离子体处理变得越来越重要。为了实现理想的材料与等离子体之间的本征反应,沿着离子能量的精确控制,目前的研究者已经发展出超净加工技术,在本项目中,我们研究了低温等离子体加工技术,重点研究了表面吸附和反应的选择性,发现了沉积和刻蚀之间的选择性反转。我们还澄清,这是由于离子辐照诱导的沉积和自由基蚀刻化学的竞争性贡献。研究了在高选择性条件下的各向异性控制和超细间距内等离子体输运,阐明了在有效离子刻蚀产率小于1的条件下获得各向异性刻蚀特性的基本工艺,多晶硅的横向刻蚀速率与载流子浓度呈线性关系,纵向刻蚀速率与载流子浓度呈平方根关系,在分子流状态下,自由基的输运可用流动方程描述。此外,我们还通过吸附反应性气体原子而不受污染气体干扰,以及通过低能离子的交替辐照,实现了自限原子层刻蚀。这可以被看作是一个最终的选择性处理,因为反应只发生在吸附位点,而不是在非吸附位点。这个项目的成功提供了一个关键的千兆规模集成过程技术,我们继续研究相关的主题。
英文摘要
Plasma processing at low temperatures becomes more and more important with advancement in ultrafine pattern device fabrication technology for silicon LSTs. The present investigators have developed ultraclean processing along with precise control of ion energy in order to realize ideal intrinsic reactions between materials and plasmas.In this project, we studied on plasma processing at low temperatures without substrate heating, focusing on selectivity in surface adsorption and reaction, and found a selectivity inversion between deposition and etching. We also clarified that this is due to a competitive contribution of ion irradiation induced deposition and radical etching chemistry. Also, we studied on anisotropy control and plasma transport within an ultrafine spacing under highly selective condition, and clarified basic process such that anisotropic etching features are obtained at an effective ion etching yield less than 1, that the lateral etch rate of polysilicon increases linearly with carrier concentration and the vertical one shows square root dependence, and that the radical transport in overetching is described by a flow equation in the molecular flow regime. Futhermore, we achieved self-limited atomic layr etching by adsorption of reactive gas atoms without disturbance by contaminant gases as well as by alternate irradiation of low energy ions. This can be regarded as a final selective processing, because the reaction occurs only at the adsorbed site and not at the non-adsorbed site.The success of this project supplies a key to giga-scale integration process technologies, and we continue to study the related subjects.
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T.Matsuura, T.Ohmi, J.Murota, and S.ono: "Perfectly selective directional etching technology by ultraclean ECR plasma" Surface Science Series. No.2, Chapter 9, Realize Inc.247-258 (1993)
T.Matsuura、T.Ohmi、J.Murota 和 S.ono:“通过超净 ECR 等离子体实现完美选择性定向蚀刻技术”表面科学系列。
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通讯作者:
T.Matsuura,et al.: "Layer-by-layer etching of Si by self-limited adsorption of chlorine with alternated irradiation of low enrgy Ar^+ ions" Ext.Abstr.Int.Conf.on Solid State Devices and Materials. 83-85 (1993)
T.Matsuura 等人:“通过自限吸附氯并交替照射低能 Ar 离子来对 Si 进行逐层蚀刻”《固态器件和材料》Ext.Abstr.Int.Conf.on 固态器件和材料。
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T.Maatsuura, J.Murata, Y.Sawada, and T.Ohmi: "Layr-by-layr etching of Si by self-limited adsorption of chlorine with alternated irradiation of low energy Ar^+ ions" Ext. Abstr. Int. Conf. on Solid State devices and Materials. August 29 - September 1. 83-8
T.Maatsuura、J.Murata、Y.Sawada 和 T.Ohmi:“通过低能 Ar 离子的交替照射,通过氯的自限吸附来逐层蚀刻 Si”。
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T.Matsuura, J.Murota, T.Ohmi, Y.Sawada, and S.Ono: "Highly selective and atomic layr controlled etching by ultraclean ECR plasmas" Proc. Int. Conf. on advanced Microelectronic Devices and Processing. March 3-5 (invited). 139-146 (1994)
T.Matsuura、J.Murota、T.Ohmi、Y.Sawada 和 S.Ono:“超净 ECR 等离子体的高选择性和原子层控制蚀刻”Proc。
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T.Matsuura, J.Murota, T.Ohmi, and S.Ono: "Side etch control of n^+-polysilicon with nitrogen added chlorine plasma" Ext. Abstr. Int. Conf. on Solid State devices and Materials. August 26-28. 418-419 (1992)
T.Matsuura、J.Murota、T.Ohmi 和 S.Ono:“用氮添加氯等离子体对 n^-多晶硅进行侧面蚀刻控制”
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