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Optical measurement technology and application using two photon absorption (TPA) on an image sensor

图像传感器上使用双光子吸收（TPA）的光学测量技术及应用

基本信息

批准号：
14350032
负责人：
KUROKAWA Takashi
金额：
$ 9.6万
依托单位：
Tokyo University Of Agriculture and Technology
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B)
财政年份：
2002
资助国家：
日本
起止时间：
2002 至 2003
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-14350032/
关键词：
Two photon absorption Surface measurement Optical microwave Short pulse

项目摘要

In normal sense, Si photodiode (Si-PD) is not sensitive to near infrared light because a band-gap of the Si crystal is generally wider than the energy of infrared light. Otherwise, in case that the Si-PD is exposed to extremely strong laser light, electric carriers are induced in proportional to the square of incident power of light according to two-photon absorption (TPA) process. By using this TPA technique, it is developed to observe an intensity correlation between two optical microwaves and between ultra-short optical pulses. The goal of this project was to progress a novel tomography with a dynamic range wider than mm to several 10mm, which is difficult to achieve with normal interferometric measurements.In 2002 fiscal year, a basic system of tomography had been investigated. As a first step, the property of the TPA process on the Si-APD (Si avalanche photodiode) was evaluated with an optical microwave by measuring an optical pass difference of two fibers in optical fiber interfe … More rometer. In order to remove noise caused by interference of carrier lights, the lights from two different optical passes, which consist of PM fibers, were combined at a right angle condition. The result proved that 1m and 2m optical pass differences were detected with 3x10^<-5> of measurement accuracy.In 2003 fiscal year, temperature dependence of output property of TPA had been studied in a viewpoint to make the measurement accuracy better. It was confirmed that the square property of the TPA process was appeared even by not only a relatively weak intensity light but also relatively strong incident light which gave intensity saturation under the condition without temperature control. Moreover, it was also confirmed to enable to measure intensity correlation without interference of carrier components independent on any polarization condition, which was obtained with beat optical microwave from two different lights at wavelength. Measurement accuracy was decided as 10^<-5>. In the other side, we also demonstrated a novel waveform measurement system of ultra-short optical pulses. Two polarization directions of divided incident lights were set at a right angle condition in order to avoid making two incident lights interfered, and was lead to an image sensor at slightly different incident angle to get auto-correlation of the pulses. In principle with this system, only one-shot gives a pulse waveform. According to a result of the experiment, 40fs waveform of ultra-short optical pulse was successfully detected. Less

在正常意义上，硅光电二极管(Si-PD)对近红外光不敏感，因为硅晶体的带隙一般比红外光的能量宽。另外，当Si-Pd被极强的激光照射时，根据双光子吸收(TPA)过程，电子载流子与入射光功率的平方成正比。利用这种TPA技术，可以观测到两个光微波之间以及超短光脉冲之间的强度关联。该项目的目标是发展一种新型的层析成像，其动态范围从毫米到几毫米，这是常规干涉测量难以实现的。在2002财年，研究了层析成像的基本系统。作为第一步，利用光微波技术，通过测量光纤接口…中两根光纤的光程差，评估了硅雪崩光电二极管的热功率放大器工艺特性更多的里程。为了消除载波光干扰引起的噪声，将由PM光纤组成的两个不同光路的光按直角组合。结果表明，1m和2m光程差的测量精度分别为3×10；-5和3×10~(-5)。2003财年，为了提高测量精度，对TPA输出特性的温度依赖性进行了研究。结果表明，即使在相对较弱的入射光和较强的入射光的作用下，TPA过程也表现出方向性，在没有温度控制的情况下，达到强度饱和。此外，还证实了利用两个不同波长的光的拍频光微波可以测量强度相关性，而不受任何偏振条件下载波分量的干扰。测量精度为10^&lt；-5&gt；。另一方面，我们还展示了一种新型的超短光脉冲波形测量系统。为了避免两个入射光的干涉，将分割的入射光的两个偏振方向设置为直角，并将其引入到入射角度略有不同的图像传感器中，以获得脉冲的自相关。原则上，使用该系统时，只需一次激发即可产生脉冲波形。根据实验结果，成功地检测到了40fs的超短光脉冲波形。较少