Research on inspection technique of printed circuit board using the probe composed of GMR sensor and planar coil
Research on inspection technique of printed circuit board using the probe composed of GMR sensor and planar coil
批准号:
14350218
负责人:
YAMADA Sotoshi
金额:
$8.83万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2002
资助国家:
日本
项目状态:
已结题
起止时间:
2002 至 2004
中文摘要
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英文摘要
The purpose of this study is to contribute to the progress of the high density mounting of electronic equipment by the nature inspection method of the high-density printed wiring based on the compound eddy current testing (ECT) probe by supersensitive magneto-resistance element (GMR). In the features, the testing equipment using eddy-current technology in the printed wiring inspection directly examines electro-conductivity of the printed wiring conductor by eddy currents in comparison with the method by image inspection which is the mainstream.[1]Development of multi-GMR sensor and examination of characteristicsWe developed the multi-GMR sensor for eddy-current probe. There are two type GMR of 50 and 100 mm length which has the sensitivity of 0.2 mV/μT at 1.0 MHz. It is clarified that the sensitivity of the GMR is about 40 dB higher than inductive coil at the same size.[2]Inspection of printed circuit board by eddy-current probe with GMR sensor.The characteristic for the printed circuit board inspection was measured by the production of GMR+ planar coil compound probe which made high frequency exciting coil and SV-GMR to be the detection sensor. For printed circuit testing with 70-100 μm width, the disconnection, 20 % chipping defect, 50 % depth imperfection can be detected from the experimental result.[3]Software for recognizing defectThe signal processing software that extracts the defect portion from two-dimensional detection signal image was developed.[4]Technology exchange with inspection equipment manufacturing company.With the aim of the construction of high-density printed wiring testing system using the eddy current testing probe, the exchange and transfer of technology were tried for GMR element manufacturer, ECT technology manufacturer, and testing equipment manufacturer.
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High-Freqency, Low-Amplitude Magnetic Field Characteristics of SV-GMR Sensor for ECT Technique
用于 ECT 技术的 SV-GMR 传感器的高频、低幅磁场特性
DOI:
--
发表时间:
2004
期刊:
Transaction on Magnetics Society of Japan (in Japanese) 28, 3
影响因子:
--
作者:
[Y.Fukuda, K.Chomsuwan, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji]
通讯作者:
S.Shoji
Enhancing the Sensitivity and Resolution of Multi-ECT Probe for Inspection of Printed Circuit Board
提高用于印刷电路板检测的 Multi-ECT 探头的灵敏度和分辨率
DOI:
--
发表时间:
2003
期刊:
Transaction on Magnetics Society of Japan (in Japanese) 27, 4
影响因子:
--
作者:
[K.Nakamura, S.Yamada, M.Iwahara, T.Taniguchi]
通讯作者:
T.Taniguchi
Bare PCB Inspection by Mean of ECT Technique with Spin-Valve GMR
利用 ECT 技术和旋转阀 GMR 进行裸 PCB 检测
DOI:
--
发表时间:
2005
期刊:
Proceeding of World Conference on Nondestructive Testing (印刷中)
影响因子:
--
作者:
[K.Chomsuwan]
通讯作者:
K.Chomsuwan
GMR Sensor Utilization for PCB Inspection Based on the Eddy-Current Testing Technique
基于涡流检测技术的 GMR 传感器用于 PCB 检测
DOI:
--
发表时间:
2004
期刊:
Transaction on Magnetics Society of Japan 4
影响因子:
--
作者:
[K.Chomsuwan]
通讯作者:
K.Chomsuwan
K.Chomusuwan, Y.Fukuda, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji: "Inspection of PCB Defects by Using ECT Technique with GMR Sensor"Proceeding of Japan-Australia-New Zealand Joint Seminar on Application of Electromagnetic Phenomena in Electrical and Mecha
K.Chomusuwan、Y.Fukuda、S.Yamada、M.Iwahara、H.Wakiwaka、S.Shoji:“利用 ECT 技术和 GMR 传感器检测 PCB 缺陷”日本-澳大利亚-新西兰应用联合研讨会论文集
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
共 32 条
Development of low-invasive/non-destructive measurements by using needle-type magnetic resistance probe with micro driving mechanism
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批准号:22360163
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$11.9万
-
财政年份:2010
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负责人:YAMADA Sotoshi
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依托单位:
Research on generation of pulse power, and sterilization and inactivation by magnetostrictive actuator
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批准号:22656067
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项目类别:Grant-in-Aid for Challenging Exploratory Research
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资助金额:$2.28万
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财政年份:2010
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负责人:YAMADA Sotoshi
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依托单位:
微細平面コイルによる金属体極表面の性状検出と初期劣化の推定に関する研究
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批准号:11650421
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$1.34万
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财政年份:1999
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负责人:YAMADA Sotoshi
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依托单位:
Study on the configuration and structure of higher-capacity flux-concentration type electromagnetic pump
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批准号:07555089
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$1.47万
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财政年份:1995
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负责人:YAMADA Sotoshi
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依托单位:
Study on flux-differential type eddy-current testing technique by planar coils
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批准号:07650481
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$1.41万
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财政年份:1995
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负责人:YAMADA Sotoshi
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依托单位:
海外基金